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X-ray structural characterization of individual as-grown GaAs/(In,Ga)As/(GaAs) based core-multi-shell nanowires

vorgelegt von M. Sc. Ali Al Hassan ; Gutachter: Prof. Dr. Dr. Ullrich Pietsch
Siegen (2019) ; Siegen: Universitätsbibliothek (2020): 2019
Online Academic Publication, Monograph - 1 Online-Ressource (xii, 115 Seiten)

Title:
X-ray structural characterization of individual as-grown GaAs/(In,Ga)As/(GaAs) based core-multi-shell nanowires
Author details: vorgelegt von M. Sc. Ali Al Hassan ; Gutachter: Prof. Dr. Dr. Ullrich Pietsch
Author / Contributor: Al Hassan, Ali ; Pietsch, Ullrich (1952-)
Corporate body: Universität Siegen
Link:
Related work:
Publication: Siegen (2019) ; Siegen: Universitätsbibliothek (2020), 2019
Media Type: Academic Publication, Monograph
Pagination: 1 Online-Ressource (xii, 115 Seiten)
DOI: 10.25819/ubsi/730
Additional details:
  • Identifier: urn:nbn:de:hbz:467-15562
  • Online-Ressource [Kann nicht per Fernleihe bestellt werden!]
  • Zusammenfassung in deutscher Sprache
  • Universität Siegen Dissertation, 2019
  • hbz Verbund-ID: HT020363044
  • Lokale Notationen: UIQN; UIUD; UIO; UIUG; ZZZB

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