Interface Trap Charges Analysis on DC and High Frequency Characteristics of UTBB-FDSOI FET
In: Silicon, Jg. 15 (2023), Heft 2, S. 937-942
Online
academicJournal
Zugriff:
Titel: |
Interface Trap Charges Analysis on DC and High Frequency Characteristics of UTBB-FDSOI FET
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Autor/in / Beteiligte Person: | Awadhiya, Bhaskar ; Yadav, Shivendra ; Acharya, Abhishek |
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Zeitschrift: | Silicon, Jg. 15 (2023), Heft 2, S. 937-942 |
Veröffentlichung: | 2023 |
Medientyp: | academicJournal |
ISSN: | 1876-990X (print) ; 1876-9918 (print) |
DOI: | 10.1007/s12633-022-02053-3 |
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