Functional Size Measurement Quality Challenges for Inexperienced Measurers
In: Software Process and Product Measurement : International Conferences IWSM 2009 and Mensura 2009 Amsterdam, The Netherlands, November 4-6, 2009. Proceedings, Jg. 5891 (2009), S. 157-169
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Zugriff:
| Titel: |
Functional Size Measurement Quality Challenges for Inexperienced Measurers
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| Autor/in / Beteiligte Person: | Trudel, Sylvie ; Abran, Alain ; Hutchison, David [Ed.] ; Kanade, Takeo [Ed.] ; Kittler, Josef [Ed.] ; Kleinberg, Jon M. [Ed.] ; Mattern, Friedemann [Ed.] ; Mitchell, John C. [Ed.] ; Naor, Moni [Ed.] ; Nierstrasz, Oscar [Ed.] ; Pandu Rangan, C. [Ed.] ; Steffen, Bernhard [Ed.] ; Sudan, Madhu [Ed.] ; Terzopoulos, Demetri [Ed.] ; Tygar, Doug [Ed.] ; Vardi, Moshe Y. [Ed.] ; Weikum, Gerhard [Ed.] ; Abran, Alain [Ed.] ; Braungarten, René [Ed.] ; Dumke, Reiner R. [Ed.] ; Cuadrado-Gallego, Juan J. [Ed.] ; Brunekreef, Jacob [Ed.] |
| Zeitschrift: | Software Process and Product Measurement : International Conferences IWSM 2009 and Mensura 2009 Amsterdam, The Netherlands, November 4-6, 2009. Proceedings, Jg. 5891 (2009), S. 157-169 |
| Veröffentlichung: | 2009 |
| Medientyp: | E-Book |
| ISBN: | 978-3-642-05414-3 (print) ; 978-3-642-05415-0 (print) |
| DOI: | 10.1007/978-3-642-05415-0_12 |
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