Measurement of transient atomic displacements in thin films with picosecond and femtometer resolution.
In: Structural dynamics (Melville, N.Y.), Jg. 1 (2014-05-01), Heft 3
academicJournal
- 034301
Zugriff:
We report measurements of the transient structural response of weakly photo-excited thin films of BiFeO3, Pb(Zr,Ti)O3, and Bi and time-scales for interfacial thermal transport. Utilizing picosecond x-ray diffraction at a 1.28 MHz repetition rate with time resolution extending down to 15 ps, transient changes in the diffraction angle are recorded. These changes are associated with photo-induced lattice strains within nanolayer thin films, resolved at the part-per-million level, corresponding to a shift in the scattering angle three orders of magnitude smaller than the rocking curve width and changes in the interlayer lattice spacing of fractions of a femtometer. The combination of high brightness, repetition rate, and stability of the synchrotron, in conjunction with high time resolution, represents a novel means to probe atomic-scale, near-equilibrium dynamics.
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Measurement of transient atomic displacements in thin films with picosecond and femtometer resolution.
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Autor/in / Beteiligte Person: | Kozina, M ; Hu, T ; Wittenberg, JS ; Szilagyi, E ; Trigo, M ; Miller, TA ; Uher, C ; Damodaran, A ; Martin, L ; Mehta, A ; Corbett, J ; Safranek, J ; Reis, DA ; Lindenberg, AM |
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Zeitschrift: | Structural dynamics (Melville, N.Y.), Jg. 1 (2014-05-01), Heft 3 |
Veröffentlichung: | eScholarship, University of California, 2014 |
Medientyp: | academicJournal |
Umfang: | 034301 |
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