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ELECTRO-STATIC DISCHARGE CLAMP (ESD) FOR NxVDD POWER RAIL

2013
Online Patent

Titel:
ELECTRO-STATIC DISCHARGE CLAMP (ESD) FOR NxVDD POWER RAIL
Link:
Veröffentlichung: 2013
Medientyp: Patent
Sonstiges:
  • Nachgewiesen in: USPTO Patent Applications
  • Sprachen: English
  • Document Number: 20130235497
  • Publication Date: September 12, 2013
  • Appl. No: 13/415621
  • Application Filed: March 08, 2012
  • Assignees: TAIWAN SEMICONDUCTOR MANUFACTURING CO. LTD. (Hsin-Chu, TW)
  • Claim: 1. A circuit with an electro-static discharge clamp coupled to a first power source and second power source, comprising:. an NMOS transistor stack comprising: a first NMOS transistor with gate node ng1 and a drain connected to the second power source; a second NMOS transistor with gate node ng2, the second NMOS transistor being stacked with the first NMOS transistor and a source connected to ground; and an electro-static discharge detector configured to control the NMOS transistor stack.
  • Claim: 2. The circuit of claim 1, wherein the voltage of the second power source is greater than the voltage of the first power source.
  • Claim: 3. The circuit of claim 2, the electro-static discharge detector further comprising: a first switch configured to switch the gate node ng1 to the second power source.
  • Claim: 4. The circuit of claim 3, the electro-static discharge detector further comprising: a second switch configured to switch the gate node ng1 to the gate node ng2.
  • Claim: 5. The circuit of claim 4, the electro-static discharge detector further comprising: a third switch configured to switch the gate node ng2 to the ground.
  • Claim: 6. The circuit of claim 5, wherein during a normal operation, the first switch is open; the second switch is open; and the third switch is short.
  • Claim: 7. The circuit of claim 6, wherein during an electronic discharge event, the first switch is short; the second switch is short; and the third switch is open.
  • Claim: 8. The circuit of claim 7, wherein the electro-static discharge detector further comprises: an electro-static discharge sensor configured to control the second switch and the third switch.
  • Claim: 9. The circuit of claim 8, wherein the electro-static discharge sensor is a resistance-capacitance (RC).
  • Claim: 10. The circuit of claim 9, wherein the second switch is a PMOS transistor.
  • Claim: 11. The circuit of claim 10, wherein the third switch is a third NMOS transistor.
  • Claim: 12. The circuit of claim 11, the wherein the first switch is a capacitor.
  • Claim: 13. The circuit of claim 11, the wherein the first switch is a diode string.
  • Claim: 14. The circuit of claim 10, wherein the electro-static discharge sensor is a latch circuit detector.
  • Claim: 15. The circuit of claim 14, wherein the second switch is a PMOS transistor.
  • Claim: 16. The circuit of claim 15, wherein the third switch is a third NMOS transistor.
  • Claim: 17. The circuit of claim 9, the wherein the capacitor is an NMOS, PMOS MIM (Metal-Insulator-Metal) or MOM (Metal Oxide Metal) capacitor.
  • Claim: 18. The circuit of claim 12, the wherein the capacitor is an NMOS, PMOS MIM (Metal-Insulator-Metal) or MOM (Metal Oxide Metal) capacitor.
  • Claim: 19. A circuit with an electro-static discharge clamp coupled to a first power source and second power source, comprising: an NMOS transistor stack comprising: a first NMOS transistor with gate node ng1 and a drain connected to the second power source; a second NMOS transistor with gate node ng2, the second NMOS transistor being stacked with the first NMOS transistor and a source connected to ground; and an electro-static discharge detector configured to control the NMOS transistor stack; a first switch configured to switch the gate node ng 1 to the second power source; a second switch configured to switch the gate node ng1 to the gate node ng2; a third switch configured to switch the gate node ng2 to the ground; and an electro-static discharge sensor configured to control the second switch and the third switch; wherein the voltage of the second power source is greater than the voltage of the first power source.
  • Claim: 20. A method of operating an electro-static discharge clamp coupled to a first power source and second power source during an electronic discharge event, comprising: shorting a first switch configured to switch a gate node ng1 of a first NMOS transistor to the second power source, the first NMOS transistor having a drain connected to the second power source; shorting a second switch configured to switch the gate node ng1 to the gate node ng2 of a second NMOS transistor, the second NMOS transistor being stacked with the first NMOS transistor and having a source connected to ground; and opening a third switch configured to switch the gate node ng2 to the ground.
  • Current U.S. Class: 361/56
  • Current International Class: 02

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