TLP/VFTLP investigation on eNVM 1T1R PCM in FD-SOI UTBB CMOS technology at room temperature
In: Microelectronics Reliability, Jg. 148 (2023-09-01)
Online
academicJournal
Zugriff:
Titel: |
TLP/VFTLP investigation on eNVM 1T1R PCM in FD-SOI UTBB CMOS technology at room temperature
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Autor/in / Beteiligte Person: | Galy, Ph. ; Jacquier, B. ; Sandrini, J. ; Arnaud, F. |
Link: | |
Zeitschrift: | Microelectronics Reliability, Jg. 148 (2023-09-01) |
Veröffentlichung: | 2023 |
Medientyp: | academicJournal |
ISSN: | 0026-2714 (electronic) |
DOI: | 10.1016/j.microrel.2023.115168 |
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