Bias Dependence of Total Ionizing Dose Response in UTBB FD-SOI Transistors
In: IEEE Transactions on Nuclear Science, Jg. 69 (2022-12-01), Heft 12, S. 2314-2323
Online
academicJournal
Zugriff:
Titel: |
Bias Dependence of Total Ionizing Dose Response in UTBB FD-SOI Transistors
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Autor/in / Beteiligte Person: | Zhang, R. ; Zheng, Q. ; Cui, J. ; Li, Y. ; Yu, X. ; Lu, W. ; Guo, Q. |
Link: | |
Zeitschrift: | IEEE Transactions on Nuclear Science, Jg. 69 (2022-12-01), Heft 12, S. 2314-2323 |
Veröffentlichung: | 2022 |
Medientyp: | academicJournal |
ISSN: | 0018-9499 (print) ; 1558-1578 (print) |
DOI: | 10.1109/TNS.2022.3219432 |
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