A Comparative Study on Heavy-Ion Irradiation Impact on p-Channel and n-Channel Power UMOSFETs
In: IEEE Transactions on Nuclear Science, Jg. 69 (2022-06-01), Heft 6, S. 1249-1256
Online
academicJournal
Zugriff:
Titel: |
A Comparative Study on Heavy-Ion Irradiation Impact on p-Channel and n-Channel Power UMOSFETs
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Autor/in / Beteiligte Person: | Wang, Y. ; Yu, C. ; Li, X. ; Yang, J. |
Link: | |
Zeitschrift: | IEEE Transactions on Nuclear Science, Jg. 69 (2022-06-01), Heft 6, S. 1249-1256 |
Veröffentlichung: | 2022 |
Medientyp: | academicJournal |
ISSN: | 0018-9499 (print) ; 1558-1578 (print) |
DOI: | 10.1109/TNS.2022.3175954 |
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