The Majority Gate as a Source of Error Pulses in Redundancy Systems when Collecting Charge from the Tracks of Single Particles
In: IEEE 32nd International Conference on Microelectronics (MIEL); (2021-09-12) S. 325-328
Online
Konferenz
Zugriff:
Titel: |
The Majority Gate as a Source of Error Pulses in Redundancy Systems when Collecting Charge from the Tracks of Single Particles
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Autor/in / Beteiligte Person: | Katunin, Yu. V. ; Stenin, V. Ya. |
Link: | |
Quelle: | IEEE 32nd International Conference on Microelectronics (MIEL); (2021-09-12) S. 325-328 |
Veröffentlichung: | 2021 |
Medientyp: | Konferenz |
ISBN: | 978-1-6654-4528-3 (print) |
ISSN: | 2159-1679 (print) |
DOI: | 10.1109/MIEL52794.2021.9569150 |
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