Impact of Interface Trap Charge on Analog/RF parameters of Novel Heterogeneous Gate Dielectric Tri-Metal Gate FinFET
In: International Conference on Communication, Control and Information Sciences (ICCISc); Jg. 1 (2021-06-16) S. 1-6
Online
Konferenz
Zugriff:
Titel: |
Impact of Interface Trap Charge on Analog/RF parameters of Novel Heterogeneous Gate Dielectric Tri-Metal Gate FinFET
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Autor/in / Beteiligte Person: | Saraswat, Somya ; Yadav, Dharmendra Singh |
Link: | |
Quelle: | International Conference on Communication, Control and Information Sciences (ICCISc); Jg. 1 (2021-06-16) S. 1-6 |
Veröffentlichung: | 2021 |
Medientyp: | Konferenz |
ISBN: | 978-1-6654-0295-8 (print) ; 978-1-6654-1279-7 (print) |
DOI: | 10.1109/ICCISc52257.2021.9484911 |
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