Assessment of Analog/RF performances for 10 nm Tri-metal Gate FinFET
In: 4th IEEE Electron Devices Technology & Manufacturing Conference (EDTM); (2020-04-01) S. 1-4
Online
Konferenz
Zugriff:
Titel: |
Assessment of Analog/RF performances for 10 nm Tri-metal Gate FinFET
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Autor/in / Beteiligte Person: | Nikhil, G.P. ; Routray, S. ; Pradhan, K.P. |
Link: | |
Quelle: | 4th IEEE Electron Devices Technology & Manufacturing Conference (EDTM); (2020-04-01) S. 1-4 |
Veröffentlichung: | 2020 |
Medientyp: | Konferenz |
ISBN: | 978-1-7281-2539-8 (print) |
DOI: | 10.1109/EDTM47692.2020.9117846 |
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