Enhanced Trench Shielded Power UMOSFET for Single Event Burnout Hardening
In: IEEE Regional Symposium on Micro and Nanoelectronics (RSM); (2019-08-01) S. 91-94
Online
Konferenz
Zugriff:
Titel: |
Enhanced Trench Shielded Power UMOSFET for Single Event Burnout Hardening
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Autor/in / Beteiligte Person: | Krishnamurthy, Saranya ; Kannan, Ramani ; Hussin, Fawnizu Azmadi ; Yahya, Erman Azwan |
Link: | |
Quelle: | IEEE Regional Symposium on Micro and Nanoelectronics (RSM); (2019-08-01) S. 91-94 |
Veröffentlichung: | 2019 |
Medientyp: | Konferenz |
ISBN: | 978-1-7281-0460-7 (print) ; 978-1-7281-0459-1 (print) |
ISSN: | 2639-4642 (print) |
DOI: | 10.1109/RSM46715.2019.8943495 |
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