Impact of TID Irradiation on Static Noise Margin of 22 nm UTBB FD-SOI 6-T SRAM Cells
In: IEEE Transactions on Nuclear Science, Jg. 71 (2024-03-01), Heft 3, S. 281-287
Online
academicJournal
Zugriff:
Titel: |
Impact of TID Irradiation on Static Noise Margin of 22 nm UTBB FD-SOI 6-T SRAM Cells
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Autor/in / Beteiligte Person: | Zheng, Q. ; Cui, J. ; Li, Y. ; Guo, Q. |
Link: | |
Zeitschrift: | IEEE Transactions on Nuclear Science, Jg. 71 (2024-03-01), Heft 3, S. 281-287 |
Veröffentlichung: | 2024 |
Medientyp: | academicJournal |
ISSN: | 0018-9499 (print) ; 1558-1578 (print) |
DOI: | 10.1109/TNS.2024.3360485 |
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