UTBB FD-SOI Variability Characterization Using Programmable Transistor Arrays
In: IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA); (2023-07-24) S. 1-7
Online
Konferenz
Zugriff:
Titel: |
UTBB FD-SOI Variability Characterization Using Programmable Transistor Arrays
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Autor/in / Beteiligte Person: | Mahmoud, M. Mounir ; Prinzie, J. ; Belie, A. Adebabay ; De Raedemaeker, S. ; Leroux, P. |
Link: | |
Quelle: | IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA); (2023-07-24) S. 1-7 |
Veröffentlichung: | 2023 |
Medientyp: | Konferenz |
ISBN: | 979-8-3503-0164-9 (print) |
ISSN: | 1946-1550 (print) |
DOI: | 10.1109/IPFA58228.2023.10249085 |
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