An assessment of the potential benefits of ion implants as trace-element reference material for electron probe X-ray microanalysis: The case of invisible gold
In: American Mineralogist, Jg. 96 (2011), Heft 1, S. 53-59
academicJournal
Zugriff:
Titel: |
An assessment of the potential benefits of ion implants as trace-element reference material for electron probe X-ray microanalysis: The case of invisible gold
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Autor/in / Beteiligte Person: | Thibault, Yves ; Pratt, Allen R. |
Link: | |
Zeitschrift: | American Mineralogist, Jg. 96 (2011), Heft 1, S. 53-59 |
Veröffentlichung: | 2011 |
Medientyp: | academicJournal |
ISSN: | 1945-3027 (print) ; 0003-004X (print) |
DOI: | 10.2138/am.2011.3481 |
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