Impact of back gate biasing schemes on energy and robustness of ULV logic in 28nm UTBB FDSOI technology
In: Proceedings of the 2013 International Symposium on Low Power Electronics and Design; (2013-09-04) S. 255-260
Online
Konferenz
Zugriff:
Titel: |
Impact of back gate biasing schemes on energy and robustness of ULV logic in 28nm UTBB FDSOI technology
|
---|---|
Autor/in / Beteiligte Person: | de Streel, Guerric ; Bol, David |
Link: | |
Quelle: | Proceedings of the 2013 International Symposium on Low Power Electronics and Design; (2013-09-04) S. 255-260 |
Veröffentlichung: | 2013 |
Medientyp: | Konferenz |
DOI: | 10.5555/2648668.2648733 |
Sonstiges: |
|