Silicon-germanium for ULSI, Journal of Telecommunications and Information Technology, 2000, nr 3,4
In: Journal of Telecommunications and Information Technology, 2000
academicJournal
Zugriff:
The paper describes recent progress for the introduction of silicon-germanium, bipolar and field effect heterostructure transistors into mainstream integrated circuit application. Basic underlying concepts and device architectures which give rise to the desired performance advantages are described together with the latest state-of the-art results for HBT and MOSFET devices. The integration of such devices into viable HBT, BiCMOS and CMOS is reviewed. Other contributions that SiGe can make to enhance the performance of ULSI circuits are mentioned also.
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Silicon-germanium for ULSI, Journal of Telecommunications and Information Technology, 2000, nr 3,4
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Autor/in / Beteiligte Person: | Eccleston, Bill ; Halll, Steve |
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Zeitschrift: | Journal of Telecommunications and Information Technology, 2000 |
Veröffentlichung: | Instytut Łączności - Państwowy Instytut Badawczy, Warszawa, 2000 |
Medientyp: | academicJournal |
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