Alpha-emitter induced soft-errors in CMOS 130nm SRAM: Real-time underground experiment and Monte-Carlo simulation
In: International Conference on Integrated Circuit Design and Technology (ICICDT 2010) ; https://hal.science/hal-04393654 ; International Conference on Integrated Circuit Design and Technology (ICICDT 2010), Jun 2010, Grenoble, France. pp.220-223, ⟨10.1109/ICICDT.2010.5510250⟩, 2010
Konferenz
Zugriff:
International audience ; This work reports a long-duration (> 2 years) real- time characterization study of SRAM memories at the underground laboratory of Modane (LSM) to quantify alpha- emitter radioactive impurities present in the circuit materials and responsible of soft-errors detected in absence of atmospheric neutrons. Experimental data have been obtained using ~3.5 Gbit of SRAMs manufactured in CMOS 130 nm technology. In a second part of this work, the underground experiment is simulated using a Monte-Carlo code to extract the contamination level related to the disintegration chain of uranium in silicon at secular equilibrium. Results are finally compared to data obtained from experimental counting experiments using an ultra low background alpha-particle gas proportional counter.
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Alpha-emitter induced soft-errors in CMOS 130nm SRAM: Real-time underground experiment and Monte-Carlo simulation
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| Autor/in / Beteiligte Person: | Martinie, Sébastien ; Uznanski, Slawosz ; Autran, Jean-Luc ; Roche, Philippe ; Gasiot, Gilles ; Munteanu, Daniela ; Sauze, Sébastien ; Loaiza, P. ; Warot, G. ; Zampaolo, M. ; Institut des Matériaux, de Microélectronique et des Nanosciences de Provence (IM2NP) ; Aix Marseille Université (AMU)-Université de Toulon (UTLN)-Centre National de la Recherche Scientifique (CNRS) ; STMicroelectronics Crolles (ST-CROLLES) ; Laboratoire Souterrain de Modane (LSM - UMR 6417) ; Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Institut National de Physique Nucléaire et de Physique des Particules du CNRS (IN2P3)-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes 2016-2019 (UGA 2016-2019 ) |
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| Zeitschrift: | International Conference on Integrated Circuit Design and Technology (ICICDT 2010) ; https://hal.science/hal-04393654 ; International Conference on Integrated Circuit Design and Technology (ICICDT 2010), Jun 2010, Grenoble, France. pp.220-223, ⟨10.1109/ICICDT.2010.5510250⟩, 2010 |
| Veröffentlichung: | HAL CCSD ; IEEE, 2010 |
| Medientyp: | Konferenz |
| DOI: | 10.1109/ICICDT.2010.5510250 |
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