A threshold voltage model of short-channel fully-depleted recessed-source/drain (Re-S/D) UTB SOI MOSFETs including substrate induced surface potential effects
In: Solid-State Electronics ; volume 95, page 52-60 ; ISSN 0038-1101, 2014
academicJournal
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A threshold voltage model of short-channel fully-depleted recessed-source/drain (Re-S/D) UTB SOI MOSFETs including substrate induced surface potential effects
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Autor/in / Beteiligte Person: | Kumar, Ajit ; Tiwari, Pramod Kumar |
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Zeitschrift: | Solid-State Electronics ; volume 95, page 52-60 ; ISSN 0038-1101, 2014 |
Veröffentlichung: | Elsevier BV, 2014 |
Medientyp: | academicJournal |
DOI: | 10.1016/j.sse.2014.03.004 |
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