A Variable Sampling Interval Synthetic Xbar Chart for the Process Mean
Public Library of Science, 2015
academicJournal
Zugriff:
The usual practice of using a control chart to monitor a process is to take samples from the process with fixed sampling interval (FSI). In this paper, a synthetic X¯ control chart with the variable sampling interval (VSI) feature is proposed for monitoring changes in the process mean. The VSI synthetic X¯ chart integrates the VSI X¯ chart and the VSI conforming run length (CRL) chart. The proposed VSI synthetic X¯ chart is evaluated using the average time to signal (ATS) criterion. The optimal charting parameters of the proposed chart are obtained by minimizing the out-of-control ATS for a desired shift. Comparisons between the VSI synthetic X¯ chart and the existing X¯, synthetic X¯, VSI X¯ and EWMA X¯ charts, in terms of ATS, are made. The ATS results show that the VSI synthetic X¯ chart outperforms the other X¯ type charts for detecting moderate and large shifts. An illustrative example is also presented to explain the application of the VSI synthetic X¯ chart.
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A Variable Sampling Interval Synthetic Xbar Chart for the Process Mean
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Autor/in / Beteiligte Person: | Lee, Lei Yong ; Khoo, Michael Boon Chong ; Teh, Sin Yin ; Lee, Ming Ha |
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Veröffentlichung: | Public Library of Science, 2015 |
Medientyp: | academicJournal |
DOI: | 10.1371/journal.pone.0126331 |
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