Moisture Effect on the Characteristics of Cellulosic Material Made RF Lines.
In: 2018 91st ARFTG Microwave Measurement Conference (ARFTG) ; https://hal.science/hal-01988720 ; 2018 91st ARFTG Microwave Measurement Conference (ARFTG), Jun 2018, Philadelphia, United States. pp.1-4, ⟨10.1109/ARFTG.2018.8423835⟩ ; https://www.arftg.org, 2018
Konferenz
Zugriff:
International audience ; Cellulosic materials are very interesting for electronics industry. Cheap, environment friendly, easy to produce and flexible, they could be remarkable substrates. However, the poor properties of cellulose in regard to the ambient humidity rate is a real technological lock to the development of this very promising material. We propose, in this paper, to analyze and quantify the impact of humidity upon the RF properties of cellulose papers. The proposed theoretical model for the contribution of water to losses in the medium is validated by experimental results, and thus can help for the design of transmission lines on paper substrates.
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Moisture Effect on the Characteristics of Cellulosic Material Made RF Lines.
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Autor/in / Beteiligte Person: | Guers, Cyril ; Garet, Frédéric ; Xavier, Pascal ; Huber, Patrick ; Depres, Gaël ; Artillan, Philippe ; Vuong, Tan-Phu ; Institut de Microélectronique, Electromagnétisme et Photonique - Laboratoire d'Hyperfréquences et Caractérisation (IMEP-LAHC ) ; Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Université Savoie Mont Blanc (USMB Université de Savoie Université de Chambéry )-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes 2016-2019 (UGA 2016-2019 ) ; Centre Technique du Papier (CTP) ; Université Savoie Mont Blanc (USMB Université de Savoie Université de Chambéry ) ; ANR-15-CE08-0014,MACEO,MAtériaux CEllulosiques Optimisés pour les applications radiofréquences et térahertz(2015) |
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Zeitschrift: | 2018 91st ARFTG Microwave Measurement Conference (ARFTG) ; https://hal.science/hal-01988720 ; 2018 91st ARFTG Microwave Measurement Conference (ARFTG), Jun 2018, Philadelphia, United States. pp.1-4, ⟨10.1109/ARFTG.2018.8423835⟩ ; https://www.arftg.org, 2018 |
Veröffentlichung: | HAL CCSD ; IEEE, 2018 |
Medientyp: | Konferenz |
DOI: | 10.1109/ARFTG.2018.8423835 |
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