Resonant inelastic x-ray scattering in warm-dense Fe compounds beyond the SASE FEL resolution limit
2024
Online
report
Zugriff:
Resonant inelastic x-ray scattering (RIXS) is a widely used spectroscopic technique, providing access to the electronic structure and dynamics of atoms, molecules, and solids. However, RIXS requires a narrow bandwidth x-ray probe to achieve high spectral resolution. The challenges in delivering an energetic monochromated beam from an x-ray free electron laser (XFEL) thus limit its use in few-shot experiments, including for the study of high energy density systems. Here we demonstrate that by correlating the measurements of the self-amplified spontaneous emission (SASE) spectrum of an XFEL with the RIXS signal, using a dynamic kernel deconvolution with a neural surrogate, we can achieve electronic structure resolutions substantially higher than those normally afforded by the bandwidth of the incoming x-ray beam. We further show how this technique allows us to discriminate between the valence structures of Fe and Fe$_2$O$_3$, and provides access to temperature measurements as well as M-shell binding energies estimates in warm-dense Fe compounds.
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Resonant inelastic x-ray scattering in warm-dense Fe compounds beyond the SASE FEL resolution limit
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Autor/in / Beteiligte Person: | Forte, Alessandro ; Gawne, Thomas ; El-Din, Karim K. Alaa ; Humphries, Oliver S. ; Preston, Thomas R. ; Crépisson, Céline ; Campbell, Thomas ; Svensson, Pontus ; Azadi, Sam ; Heighway, Patrick ; Shi, Yuanfeng ; Chin, David A. ; Smith, Ethan ; Baehtz, Carsten ; Bouffetier, Victorien ; Höppner, Hauke ; McGonegle, David ; Harmand, Marion ; Collins, Gilbert W. ; Wark, Justin S. ; Polsin, Danae N. ; Vinko, Sam M. |
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Veröffentlichung: | 2024 |
Medientyp: | report |
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