X-Ray Structure Investigation of Sr<subscript>3</subscript>NbGa<subscript>3</subscript>Si<subscript>2</subscript>O<subscript>14</subscript> Langasite Family Crystal.
In: Crystallography Reports, Jg. 63 (2018-05-01), Heft 3, S. 344-348
Online
academicJournal
Zugriff:
An accurate structure analysis of Sr 3 NbGa 3 Si 2 O 14 single crystals, belonging to the langasite family, has been performed. Two datasets are obtained on an Xcalibur S diffractometer equipped with a CCD detector. The structure is been refined using an averaged dataset: sp. gr. P 321, Z = 1, 295 K, sin θ/λ ≤ 1.35 Å -1 , a = 8.2797(3) Å, c = 5.0774(5) Å; the agreement factors between the model and experiment are found to be R/wR = 0.76/0.64% and Δρ min /Δρ max =-0.21/0.17 e/Å 3 for 3820 independent ref lections. The Sr 3 NbGa 3 Si 2 O 14 and Sr 3 NbFe 3 Si 2 O 14 structures are compared, and the role of magnetic ions in the predicted P321 → P3 phase transition is analyzed. [ABSTRACT FROM AUTHOR]
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Titel: |
X-Ray Structure Investigation of Sr<subscript>3</subscript>NbGa<subscript>3</subscript>Si<subscript>2</subscript>O<subscript>14</subscript> Langasite Family Crystal.
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Autor/in / Beteiligte Person: | Dudka, A. P. |
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Zeitschrift: | Crystallography Reports, Jg. 63 (2018-05-01), Heft 3, S. 344-348 |
Veröffentlichung: | 2018 |
Medientyp: | academicJournal |
ISSN: | 1063-7745 (print) |
DOI: | 10.1134/S1063774518030070 |
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