Negative and Positive Muon-Induced Single Event Upsets in 65-nm UTBB SOI SRAMs.
In: IEEE Transactions on Nuclear Science, Jg. 65 (2018-08-01), Heft 8, S. 1742-1749
Online
academicJournal
Zugriff:
Titel: |
Negative and Positive Muon-Induced Single Event Upsets in 65-nm UTBB SOI SRAMs.
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Autor/in / Beteiligte Person: | Manabe, Seiya ; Watanabe, Yukinobu ; Liao, Wang ; Hashimoto, Masanori ; Nakano, Keita ; Sato, Hikaru ; Kin, Tadahiro ; Abe, Shin-Ichiro ; Hamada, Koji ; Tampo, Motonobu ; Miyake, Yasuhiro |
Link: | |
Zeitschrift: | IEEE Transactions on Nuclear Science, Jg. 65 (2018-08-01), Heft 8, S. 1742-1749 |
Veröffentlichung: | 2018 |
Medientyp: | academicJournal |
ISSN: | 0018-9499 (print) |
DOI: | 10.1109/TNS.2018.2839704 |
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