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- issn: 2365-709x ; advanced materials technologies ; https://hal.science/hal-02263489 ; advanced materials technologies, 2018, 3 (7), pp.1800036. ⟨10.1002/admt.201800036⟩ 13 Treffer
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9.257 Treffer
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In: ISSN: 1996-1944 ; Materials ; https://hal.science/hal-03813119 ; Materials, 2022, 15 (12), pp.4070 (10). ⟨10.3390/ma15124070⟩, 2022Online academicJournalZugriff:
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In: ISSN: 1996-1944 ; Materials ; https://hal.science/hal-03813037 ; Materials, 2022, 15 (12), pp.4070 (10). ⟨10.3390/ma15124070⟩, 2022Online academicJournalZugriff:
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In: ISSN: 1996-1944 ; Materials ; https://hal.science/hal-03813119 ; Materials, 2022, 15 (12), pp.4070 (10). ⟨10.3390/ma15124070⟩, 2022Online academicJournalZugriff:
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In: ESREF 2023 - 34th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis ; https://hal.science/hal-04094354 ; ESREF 2023 - 34th European Symposium on Reliability of Electron Devices, 2023Online KonferenzZugriff:
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In: Conference on Radiation Effects on Components and Systems (RADECS 2023) ; https://hal.science/hal-04157135 ; Conference on Radiation Effects on Components and Systems (RADECS 2023), Sep 2023, Toulouse, France, 2023KonferenzZugriff:
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In: European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2023) ; https://hal.science/hal-04157172 ; European Symposium on Reliability of Electron Devices, 2023KonferenzZugriff:
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In: ESREF 2023 - 34th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis ; https://hal.science/hal-04094354 ; ESREF 2023 - 34th European Symposium on Reliability of Electron Devices, 2023Online KonferenzZugriff:
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In: RADECS2023 Conference Proceedings ; RADECS 2023 - Conference on Radiation Effects on Components and Systems (RADECS 2023) ; https://hal.science/hal-04157129 ; RADECS 2023 - Conference on Radiation Effects on Components and Systems (RADECS 2023), Sep 2023, Toulouse, France ; https://radecs2023.com/, 2023KonferenzZugriff:
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In: Conference on Radiation Effects on Components and Systems (RADECS 2023) ; https://hal.science/hal-04157135 ; Conference on Radiation Effects on Components and Systems (RADECS 2023), Sep 2023, Toulouse, France, 2023KonferenzZugriff:
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In: European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2023) ; https://hal.science/hal-04157172 ; European Symposium on Reliability of Electron Devices, 2023KonferenzZugriff:
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In: RADECS2023 Conference Proceedings ; RADECS 2023 - Conference on Radiation Effects on Components and Systems (RADECS 2023) ; https://hal.science/hal-04157129 ; RADECS 2023 - Conference on Radiation Effects on Components and Systems (RADECS 2023), Sep 2023, Toulouse, France ; https://radecs2023.com/, 2023KonferenzZugriff:
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In: 29th IEEE European Test Symposium (ETS 2024) ; https://hal.science/hal-04532564 ; 29th IEEE European Test Symposium (ETS 2024), May 2024, The Hague, Netherlands ; IEEELink, 2024Online KonferenzZugriff:
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In: Neuronics 2024 ; https://hal.science/hal-04487701 ; Neuronics 2024, Feb 2024, Valencia, Spain. ⟨10.29363/nanoge.neuronics.2024.035⟩, 2024KonferenzZugriff:
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In: Advancing Edge Artificial Intelligence ; https://hal.science/hal-04465853 ; Ovidiu VERMESAN - Dave MARPLES. Advancing Edge Artificial Intelligence, River Publishers, pp.87-103, 2024, 9781003478713. ⟨10.1201/9781003478713-4⟩; (2024)Online BuchZugriff:
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In: IEEE Latin American Test Symposium (LATS 2024) ; https://hal.science/hal-04527044 ; IEEE Latin American Test Symposium (LATS 2024), Apr 2024, Maceio, Brazil, 2024Online KonferenzZugriff:
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In: 25th IEEE Latin American Test Symposium (LATS 2024) ; https://hal.science/hal-04527025 ; 25th IEEE Latin American Test Symposium (LATS 2024), Apr 2024, Maceio, Brazil ; https://cas.polito.it/LATS2024/, 2024Online KonferenzZugriff:
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In: IEEE 24th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems (SiRF 2024) ; https://hal.science/hal-04487746 ; IEEE 24th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems (SiRF 2024), Jan 2024, San Antonio (TX), United States. ⟨10.1109/SiRF59913.2024.10438528⟩ ; IEEELink, 2024KonferenzZugriff:
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In: IEEE 24th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems (SiRF 2024) ; https://hal.science/hal-04487746 ; IEEE 24th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems (SiRF 2024), Jan 2024, San Antonio (TX), United States. ⟨10.1109/SiRF59913.2024.10438528⟩ ; IEEELink, 2024KonferenzZugriff:
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In: Proceedings ; DATE 24 - Design, Automation and Test in Europe Conference ; https://hal.science/hal-04510854 ; DATE 24 - Design, 2024Online KonferenzZugriff:
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In: 25th IEEE Latin American Test Symposium (LATS 2024) ; https://hal.science/hal-04513585 ; 25th IEEE Latin American Test Symposium (LATS 2024), Apr 2024, Maceio (Brazil), 2024Online KonferenzZugriff: