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Weniger Treffer
Art der Quelle
Thema
- engineered materials, dielectrics and plasmas 9 Treffer
- signal processing and analysis 8 Treffer
- power, energy and industry applications 7 Treffer
- electrical impedance tomography 6 Treffer
- fields, waves and electromagnetics 5 Treffer
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45 weitere Werte:
- voltage measurement 5 Treffer
- computing and processing 4 Treffer
- thorax 4 Treffer
- bioengineering 3 Treffer
- lung 3 Treffer
- robotics and control systems 3 Treffer
- amorphous materials 2 Treffer
- chalcogenide 2 Treffer
- conductivity 2 Treffer
- crystallization 2 Treffer
- electric potential 2 Treffer
- electrical impedance tomography (eit) 2 Treffer
- finite element method 2 Treffer
- nonvolatile memory 2 Treffer
- phase change materials 2 Treffer
- phase change memory 2 Treffer
- phase change memory (pcm) 2 Treffer
- random access memory 2 Treffer
- space vector pulse width modulation 2 Treffer
- three-dimensional displays 2 Treffer
- threshold voltage 2 Treffer
- 3d image reconstruction 1 Treffer
- 3d modelling 1 Treffer
- aerospace 1 Treffer
- amorphous semiconductors 1 Treffer
- anodes 1 Treffer
- arc fault 1 Treffer
- capacitance-voltage characteristics 1 Treffer
- cathodes 1 Treffer
- circuit faults 1 Treffer
- computed tomography 1 Treffer
- conductivity measurement 1 Treffer
- contact resistance 1 Treffer
- contacts 1 Treffer
- crystalline materials 1 Treffer
- current measurement 1 Treffer
- current supplies 1 Treffer
- current-voltage characteristics 1 Treffer
- data models 1 Treffer
- dc arc 1 Treffer
- deep learning 1 Treffer
- delay effects 1 Treffer
- drift 1 Treffer
- electrical resistance measurement 1 Treffer
- electron sources 1 Treffer
Publikation
- 2021 international workshop on impedance spectroscopy (iwis), impedance spectroscopy (iwis), 2021 international workshop on 2 Treffer
- 2023 20th international multi-conference on systems, signals & devices (ssd), systems, signals & devices (ssd), 2023 20th international multi-conference on 2 Treffer
- 2003 symposium on vlsi technology. digest of technical papers (ieee cat. no.03ch37407), vlsi technology, 2003. digest of technical papers. 2003 symposium on, vlsi technology 1 Treffer
- 2008 9th annual non-volatile memory technology symposium (nvmts), non-volatile memory technology symposium, 2008. nvmts 2008. 9th annual 1 Treffer
- 2009 22nd international vacuum nanoelectronics conference, vacuum nanoelectronics conference, 2009. ivnc 2009. 22nd international 1 Treffer
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5 weitere Werte:
- 2017 joint international eurosoi workshop and international conference on ultimate integration on silicon (eurosoi-ulis), ultimate integration on silicon (eurosoi-ulis), 2017 joint international eurosoi workshop and international conference on 1 Treffer
- 2020 47th ieee photovoltaic specialists conference (pvsc), photovoltaic specialists conference (pvsc), 2020 47th ieee 1 Treffer
- 2022 19th international multi-conference on systems, signals & devices (ssd), systems, signals & devices (ssd), 2022 19th international multi-conference on 1 Treffer
- 2022 international workshop on impedance spectroscopy (iwis), impedance spectroscopy (iwis), 2022 international workshop on 1 Treffer
- ieee electron device letters, electron device letters, ieee, ieee electron device lett. 1 Treffer
Inhaltsanbieter
12 Treffer
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In: 2023 20th International Multi-Conference on Systems, Signals & Devices (SSD), 2023-02-20, S. 945-950Online KonferenzZugriff:
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In: 2023 20th International Multi-Conference on Systems, Signals & Devices (SSD), 2023-02-20, S. 906-911Online KonferenzZugriff:
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In: 2022 International Workshop on Impedance Spectroscopy (IWIS), 2022-09-27, S. 70-74Online KonferenzZugriff:
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In: 2022 19th International Multi-Conference on Systems, Signals & Devices (SSD), 2022-05-06, S. 1092-1097Online KonferenzZugriff:
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In: 2021 International Workshop on Impedance Spectroscopy (IWIS), 2021-09-29, S. 114-117Online KonferenzZugriff:
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In: 2021 International Workshop on Impedance Spectroscopy (IWIS), 2021-09-29, S. 118-122Online KonferenzZugriff:
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In: 2020 47th IEEE Photovoltaic Specialists Conference (PVSC), 2020-06-14, S. 2737-2742Online KonferenzZugriff:
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In: 2017 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), 2017-04-01, S. 47-50Online KonferenzZugriff:
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In: 2008 9th Annual Non-Volatile Memory Technology Symposium (NVMTS), 2008-11-01, S. 1Online KonferenzZugriff:
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In: IEEE Electron Device Letters, Jg. 27 (2006-10-01), Heft 10, S. 808-810Online academicJournalZugriff:
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In: 2003 Symposium on VLSI Technology. Digest of Technical Papers (IEEE Cat. No.03CH37407), 2003, S. 175-176Online KonferenzZugriff:
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In: 2009 22nd International Vacuum Nanoelectronics Conference, 2009-07-01, S. 285Online KonferenzZugriff: