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1.302 Treffer

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  1. Rajappa, Anuj Justus ; Reiter, Philippe ; et al.
    In: ESREF 2023 - 34th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis ; https://hal.science/hal-04094354 ; ESREF 2023 - 34th European Symposium on Reliability of Electron Devices, 2023
    Online Konferenz
  2. Fleck, Marcos Antônio Junior ; Pereira, Elisa ; et al.
    In: Conference on Radiation Effects on Components and Systems (RADECS 2023) ; https://hal.science/hal-04157135 ; Conference on Radiation Effects on Components and Systems (RADECS 2023), Sep 2023, Toulouse, France, 2023
    Konferenz
  3. Laurini, Luiz Henrique ; dos Santos Martins, Joao Baptista ; et al.
    In: European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2023) ; https://hal.science/hal-04157172 ; European Symposium on Reliability of Electron Devices, 2023
    Konferenz
  4. Rajappa, Anuj Justus ; Reiter, Philippe ; et al.
    In: ESREF 2023 - 34th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis ; https://hal.science/hal-04094354 ; ESREF 2023 - 34th European Symposium on Reliability of Electron Devices, 2023
    Online Konferenz
  5. Gava, Jonas ; Kraemer Sarzi Sartori, Tarso ; et al.
    In: RADECS2023 Conference Proceedings ; RADECS 2023 - Conference on Radiation Effects on Components and Systems (RADECS 2023) ; https://hal.science/hal-04157129 ; RADECS 2023 - Conference on Radiation Effects on Components and Systems (RADECS 2023), Sep 2023, Toulouse, France ; https://radecs2023.com/, 2023
    Konferenz
  6. Fleck, Marcos Antônio Junior ; Pereira, Elisa ; et al.
    In: Conference on Radiation Effects on Components and Systems (RADECS 2023) ; https://hal.science/hal-04157135 ; Conference on Radiation Effects on Components and Systems (RADECS 2023), Sep 2023, Toulouse, France, 2023
    Konferenz
  7. Laurini, Luiz Henrique ; dos Santos Martins, Joao Baptista ; et al.
    In: European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2023) ; https://hal.science/hal-04157172 ; European Symposium on Reliability of Electron Devices, 2023
    Konferenz
  8. Gava, Jonas ; Kraemer Sarzi Sartori, Tarso ; et al.
    In: RADECS2023 Conference Proceedings ; RADECS 2023 - Conference on Radiation Effects on Components and Systems (RADECS 2023) ; https://hal.science/hal-04157129 ; RADECS 2023 - Conference on Radiation Effects on Components and Systems (RADECS 2023), Sep 2023, Toulouse, France ; https://radecs2023.com/, 2023
    Konferenz
  9. Fesquet, Laurent ; Lesage, Xavier ; et al.
    In: 17èmes journées pédagogiques du CNFM (JPCNFM 2023) ; https://hal.science/hal-04332030 ; 17èmes journées pédagogiques du CNFM (JPCNFM 2023), Nov 2023, Toulouse, France, 2023
    Konferenz
  10. Fesquet, Laurent ; Circuits, Devices and System Integration (TIMA-CDSI) ; et al.
    In: 17èmes journées pédagogiques du CNFM (JPCNFM 2023) ; https://hal.science/hal-04332013 ; 17èmes journées pédagogiques du CNFM (JPCNFM 2023), Nov 2023, Toulouse, France, 2023
    Konferenz
  11. Fesquet, Laurent ; Circuits, Devices and System Integration (TIMA-CDSI) ; et al.
    In: IEEE Vision workshop, Sensors and smart (AI) processing ; https://hal.science/hal-04331928 ; IEEE Vision workshop, 2023
    Konferenz
  12. Cantoro, Riccardo ; Sartoni, Sandro ; et al.
    In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT 2023) ; https://hal.science/hal-04303499 ; IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT 2023), Oct 2023, Juan-les-Pins, France. pp.1-7, ⟨10.1109/DFT59622.2023.10313531⟩ ; IEEELink, 2023
    Konferenz
  13. Tebina, Nasr-Eddine Ouldei ; Zergainoh, Nacer-Eddine ; et al.
    In: 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT 2023) ; https://hal.science/hal-04303453 ; 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT 2023), Oct 2023, Juan-les-Pins, France. ⟨10.1109/DFT59622.2023.10313564⟩ ; http://www.dfts.org/, 2023
    Online Konferenz
  14. Tebina, Nasr-Eddine Ouldei ; Zergainoh, Nacer-Eddine ; et al.
    In: 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT 2023) ; https://hal.science/hal-04303453 ; 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT 2023), Oct 2023, Juan-les-Pins, France. ⟨10.1109/DFT59622.2023.10313564⟩ ; http://www.dfts.org/, 2023
    Online Konferenz
  15. Tebina, Nasr-Eddine Ouldei ; Zergainoh, Nacer-Eddine ; et al.
    In: 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT 2023) ; https://hal.science/hal-04303453 ; 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT 2023), Oct 2023, Juan-les-Pins, France. ⟨10.1109/DFT59622.2023.10313564⟩ ; http://www.dfts.org/, 2023
    Online Konferenz
  16. Fesquet, Laurent ; Lesage, Xavier ; et al.
    In: 17èmes journées pédagogiques du CNFM (JPCNFM 2023) ; https://hal.science/hal-04332030 ; 17èmes journées pédagogiques du CNFM (JPCNFM 2023), Nov 2023, Toulouse, France, 2023
    Konferenz
  17. Fesquet, Laurent ; Circuits, Devices and System Integration (TIMA-CDSI) ; et al.
    In: 17èmes journées pédagogiques du CNFM (JPCNFM 2023) ; https://hal.science/hal-04332013 ; 17èmes journées pédagogiques du CNFM (JPCNFM 2023), Nov 2023, Toulouse, France, 2023
    Konferenz
  18. Fesquet, Laurent ; Circuits, Devices and System Integration (TIMA-CDSI) ; et al.
    In: FMNT/Summit Workshop, Low-power for a sustainable electronic ; https://hal.science/hal-04331927 ; FMNT/Summit Workshop, 2023
    Konferenz
  19. Cantoro, Riccardo ; Sartoni, Sandro ; et al.
    In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT 2023) ; https://hal.science/hal-04303499 ; IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT 2023), Oct 2023, Juan-les-Pins, France. pp.1-7, ⟨10.1109/DFT59622.2023.10313531⟩ ; IEEELink, 2023
    Konferenz
  20. Stoens, Solène ; Colas, Guillaume ; et al.
    In: 34èmes Journées Internationales Francophones de Tribologie ; https://hal.science/hal-04233192 ; 34èmes Journées Internationales Francophones de Tribologie, May 2023, Villeneuve d'Ascq, France, 2023
    Online Konferenz

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