Suchergebnisse
Katalog
Aufsätze & mehr
Suchmaske
Suchergebnisse einschränken oder erweitern
Aktive Suchfilter
Weniger Treffer
Art der Quelle
Thema
- metal oxide semiconductor field-effect transistors 47 Treffer
- logic gates 40 Treffer
- silicon 31 Treffer
- mosfet 22 Treffer
- threshold voltage 20 Treffer
-
45 weitere Werte:
- logic circuits 19 Treffer
- complementary metal oxide semiconductors 14 Treffer
- electric insulators & insulation 14 Treffer
- electric potential 14 Treffer
- electrostatics 14 Treffer
- mathematical model 14 Treffer
- semiconductors 14 Treffer
- silicon-on-insulator 14 Treffer
- mathematical models 13 Treffer
- semiconductor device modeling 13 Treffer
- transistors 13 Treffer
- ultrathin body (utb) 13 Treffer
- mosfets 12 Treffer
- silicon-on-insulator (soi) 12 Treffer
- capacitance 10 Treffer
- field-effect transistors 9 Treffer
- junctions 9 Treffer
- radiation effects 9 Treffer
- analytical models 8 Treffer
- compact modeling 8 Treffer
- gate array circuits 8 Treffer
- random access memory 8 Treffer
- computational modeling 7 Treffer
- cmos 6 Treffer
- cmos integrated circuits 6 Treffer
- computer architecture 6 Treffer
- computer-aided design 6 Treffer
- degradation 6 Treffer
- dielectrics 6 Treffer
- electric capacity 6 Treffer
- equations 6 Treffer
- finfet 6 Treffer
- finfets 6 Treffer
- fully depleted silicon-on-insulator (fdsoi) 6 Treffer
- irradiation 6 Treffer
- monte carlo method 6 Treffer
- mosfet circuits 6 Treffer
- performance evaluation 6 Treffer
- poisson equations 6 Treffer
- pulse measurement 6 Treffer
- scattering 6 Treffer
- scattering (physics) 6 Treffer
- semiconductor devices 6 Treffer
- silicon on insulator technology 6 Treffer
- single event effects 6 Treffer
Publikation
Sprache
Inhaltsanbieter
96 Treffer
-
In: IEEE Transactions on Nuclear Science, Jg. 65 (2018-08-01), Heft 8, S. 1742-1749Online academicJournalZugriff:
-
In: IEEE Transactions on Nuclear Science, Jg. 68 (2021), Heft 1, S. 21-26Online academicJournalZugriff:
-
In: IEEE Transactions on Nuclear Science, Jg. 64 (2017), Heft 1, part 1, S. 113-118Online academicJournalZugriff:
-
In: IEEE Transactions on Electron Devices, Jg. 64 (2017-10-01), Heft 10, S. 3986-3990Online academicJournalZugriff:
-
In: IEEE Transactions on Electron Devices, Jg. 64 (2017-04-01), Heft 4, S. 1575-1582Online academicJournalZugriff:
-
In: IEEE Transactions on Electron Devices, Jg. 62 (2015), Heft 1, S. 83-87Online academicJournalZugriff:
-
In: IEEE Transactions on Electron Devices, Jg. 59 (2012), Heft 1, S. 247-251Online academicJournalZugriff:
-
In: IEEE Transactions on Electron Devices, Jg. 62 (2015-09-01), Heft 9, S. 2760-2768Online academicJournalZugriff:
-
In: IEEE Transactions on Electron Devices, Jg. 62 (2015-09-01), Heft 9, S. 2751-2759Online academicJournalZugriff:
-
In: IEEE Transactions on Electron Devices, Jg. 60 (2013-04-01), Heft 4, S. 1485-1489Online academicJournalZugriff:
-
In: IEEE Transactions on Electron Devices, Jg. 61 (2014-03-01), Heft 3, S. 801-805Online academicJournalZugriff:
-
In: IEEE Transactions on Electron Devices, Jg. 61 (2014-11-01), Heft 11, S. 3632-3638Online academicJournalZugriff:
-
In: IEEE Transactions on Electron Devices, Jg. 58 (2011-08-01), Heft 8, S. 2473-2482Online academicJournalZugriff:
-
In: IEEE Transactions on Electron Devices, Jg. 55 (2008-05-01), Heft 5, S. 1203-1210Online academicJournalZugriff:
-
In: IEEE Transactions on Electron Devices, Jg. 58 (2011-03-01), Heft 3, S. 600-608Online academicJournalZugriff:
-
In: IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Jg. 23 (2015-12-01), Heft 12, S. 3133-3137Online academicJournalZugriff:
-
In: IEEE Journal of Solid-State Circuits, Jg. 52 (2017-07-01), Heft 7, S. 1927-1939Online academicJournalZugriff:
-
In: IEEE Electron Device Letters, Jg. 27 (2006-04-01), Heft 4, S. 284-287Online academicJournalZugriff:
-
In: IEEE Electron Device Letters, Jg. 26 (2005-11-01), Heft 11, S. 836-838Online academicJournalZugriff:
-
In: IEEE Transactions on Electron Devices, Jg. 63 (2016-12-01), Heft 12, S. 4913-4918Online academicJournalZugriff: