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Weniger Treffer
Art der Quelle
Thema
- engineered materials, dielectrics and plasmas 4 Treffer
- logic gates 4 Treffer
- computing and processing 2 Treffer
- fields, waves and electromagnetics 2 Treffer
- redundancy 2 Treffer
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42 weitere Werte:
- reliability engineering 2 Treffer
- signal processing and analysis 2 Treffer
- switches 2 Treffer
- adhesives 1 Treffer
- cmos technology 1 Treffer
- communication, networking and broadcast technologies 1 Treffer
- compounds 1 Treffer
- computational modeling 1 Treffer
- computer architecture 1 Treffer
- cost function 1 Treffer
- data models 1 Treffer
- delamination 1 Treffer
- design optimization 1 Treffer
- double gate mosfet 1 Treffer
- energy consumption 1 Treffer
- energy exchange 1 Treffer
- gate engineering 1 Treffer
- general topics for engineers 1 Treffer
- international electron devices meeting 1 Treffer
- materials 1 Treffer
- microprocessors 1 Treffer
- moisture 1 Treffer
- mosfet circuits 1 Treffer
- nanotechnology 1 Treffer
- performance evaluation 1 Treffer
- power, energy and industry applications 1 Treffer
- robotics and control systems 1 Treffer
- semiconductor device measurement 1 Treffer
- semiconductor device testing 1 Treffer
- silicon 1 Treffer
- solid modeling 1 Treffer
- stress 1 Treffer
- stress measurement 1 Treffer
- temperature measurement 1 Treffer
- tfets 1 Treffer
- thermal stresses 1 Treffer
- three-dimensional displays 1 Treffer
- three-dimensional integrated circuits 1 Treffer
- through-silicon vias 1 Treffer
- tunneling 1 Treffer
- vertical tfet 1 Treffer
- work-function engineering 1 Treffer
Publikation
- 2021 ieee 32nd international conference on microelectronics (miel), microelectronics (miel), 2021 ieee 32nd international conference on 2 Treffer
- 2008 symposium on vlsi technology, vlsi technology, 2008 symposium on 1 Treffer
- 2010 proceedings 60th electronic components and technology conference (ectc), electronic components and technology conference (ectc), 2010 proceedings 60th 1 Treffer
- 2013 ieee 63rd electronic components and technology conference, electronic components and technology conference (ectc), 2013 ieee 63rd 1 Treffer
- ieee transactions on electron devices, electron devices, ieee transactions on, ieee trans. electron devices 1 Treffer
- Ein weiterer Wert:
Inhaltsanbieter
7 Treffer
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In: International Conference on Recent Advances and Innovations in Engineering (ICRAIE-2014), 2014-05-01, S. 1-3Online KonferenzZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 63 (2016-12-01), Heft 12, S. 5030-5035Online academicJournalZugriff:
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In: 2021 IEEE 32nd International Conference on Microelectronics (MIEL), 2021-09-12, S. 325-328Online KonferenzZugriff:
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In: 2021 IEEE 32nd International Conference on Microelectronics (MIEL), 2021-09-12, S. 321-324Online KonferenzZugriff:
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In: 2013 IEEE 63rd Electronic Components and Technology Conference, 2013-05-01, S. 200-207Online KonferenzZugriff:
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In: 2010 Proceedings 60th Electronic Components and Technology Conference (ECTC), 2010-06-01, S. 1273-1280Online KonferenzZugriff:
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In: 2008 Symposium on VLSI Technology, 2008-06-01, S. 92Online KonferenzZugriff: