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Weniger Treffer
Art der Quelle
Thema
- engineered materials, dielectrics and plasmas 7 Treffer
- amorphous materials 5 Treffer
- phase change materials 5 Treffer
- crystallization 4 Treffer
- random access memory 4 Treffer
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45 weitere Werte:
- general topics for engineers 3 Treffer
- phase change memory 3 Treffer
- signal processing and analysis 3 Treffer
- analytical models 2 Treffer
- cmos process 2 Treffer
- cmos technology 2 Treffer
- computing and processing 2 Treffer
- electrodes 2 Treffer
- ferroelectric films 2 Treffer
- ovonic unified memory (oum) 2 Treffer
- phase change random access memory 2 Treffer
- photonics and electrooptics 2 Treffer
- thermal conductivity 2 Treffer
- very large scale integration 2 Treffer
- voltage 2 Treffer
- amorphous semiconductors 1 Treffer
- capacitance-voltage characteristics 1 Treffer
- cellular phones 1 Treffer
- chalcogenide 1 Treffer
- cmos logic circuits 1 Treffer
- commercialization 1 Treffer
- consumer electronics 1 Treffer
- contact resistance 1 Treffer
- copper 1 Treffer
- costs 1 Treffer
- current supplies 1 Treffer
- electric resistance 1 Treffer
- electrothermal effects 1 Treffer
- electrothermal modeling 1 Treffer
- energy consumption 1 Treffer
- etching 1 Treffer
- fabrication 1 Treffer
- fault tolerant systems 1 Treffer
- flash memory 1 Treffer
- heat transfer 1 Treffer
- high k dielectric materials 1 Treffer
- high-k gate dielectrics 1 Treffer
- indium oxide 1 Treffer
- instruments 1 Treffer
- logic devices 1 Treffer
- low voltage 1 Treffer
- magnetic field measurement 1 Treffer
- material storage 1 Treffer
- nanocrystals 1 Treffer
- nanoparticles 1 Treffer
Publikation
- ieee electron device letters, electron device letters, ieee, ieee electron device lett. 2 Treffer
- 19th ieee international symposium on defect and fault tolerance in vlsi systems, 2004. dft 2004. proceedings., defect and fault tolerance in vlsi systems, 2004. dft 2004. proceedings. 19th ieee international symposium on, defect and fault tolerance in vlsi systems 1 Treffer
- 2002 ieee international solid-state circuits conference. digest of technical papers (cat. no.02ch37315), solid-state circuits conference, 2002. digest of technical papers. isscc. 2002 ieee international, solid-state circuits conference 1 Treffer
- 2008 11th intersociety conference on thermal and thermomechanical phenomena in electronic systems, thermal and thermomechanical phenomena in electronic systems, 2008. itherm 2008. 11th intersociety conference on 1 Treffer
- 2017 joint international eurosoi workshop and international conference on ultimate integration on silicon (eurosoi-ulis), ultimate integration on silicon (eurosoi-ulis), 2017 joint international eurosoi workshop and international conference on 1 Treffer
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4 weitere Werte:
- 63rd device research conference digest, 2005. drc '05., device research conference digest, 2005. drc '05. 63rd 1 Treffer
- international electron devices meeting. technical digest (cat. no.01ch37224), electron devices meeting, 2001. iedm '01. technical digest. international, electron devices meeting 2001 1 Treffer
- international workshops and tutorials on electron devices and materials, electron devices and materials, 2006. proceedings. 7th annual 2006 international workshop and tutorials on, electron devices and materials 1 Treffer
- thermal and thermomechanical proceedings 10th intersociety conference on phenomena in electronics systems, 2006. itherm 2006., thermal and thermomechanical phenomena in electronics systems, 2006. itherm '06. the tenth intersociety conference on, thermal and thermomechanical phenomena in electronics systems 1 Treffer
Inhaltsanbieter
10 Treffer
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In: International Electron Devices Meeting. Technical Digest (Cat. No.01CH37224), 2001, S. 1Online KonferenzZugriff:
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In: 2017 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), 2017-04-01, S. 47-50Online KonferenzZugriff:
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In: IEEE Electron Device Letters, Jg. 28 (2007-08-01), Heft 8, S. 697-699Online academicJournalZugriff:
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In: IEEE Electron Device Letters, Jg. 27 (2006-10-01), Heft 10, S. 808-810Online academicJournalZugriff:
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In: Thermal and Thermomechanical Proceedings 10th Intersociety Conference on Phenomena in Electronics Systems, 2006. ITHERM, 2006, S. 660-665Online KonferenzZugriff:
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In: 2008 11th Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems, 2008-05-01, S. 1046Online KonferenzZugriff:
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In: 63rd Device Research Conference Digest, 2005. DRC, Jg. 1 (2005), S. 29-33Online KonferenzZugriff:
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In: 19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2004. DFT, 2004, S. 347-355Online KonferenzZugriff:
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In: 2002 IEEE International Solid-State Circuits Conference. Digest of Technical Papers (Cat. No.02CH37315), Jg. 1 (2002), S. 202-451Online KonferenzZugriff:
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In: International Workshops and Tutorials on Electron Devices and Materials, 2006-07-01, S. 15-17Online KonferenzZugriff: