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In: IEEE Transactions on Semiconductor Manufacturing, Jg. 34 (2021-08-01), Heft 3, S. 286-290Online academicJournalZugriff:
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In: IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems, Jg. 37 (2018-11-01), Heft 11, S. 2918-2928Online academicJournalZugriff:
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In: IEEE Transactions on Aerospace & Electronic Systems, Jg. 51 (2015-07-01), Heft 3, S. 2193-2204Online academicJournalZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 61 (2014-05-01), Heft 5, S. 1221-1221Online academicJournalZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 60 (2013-10-01), Heft 10, S. 2974-2974Online academicJournalZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 64 (2017-08-01), Heft 8, S. 3132-3138Online academicJournalZugriff:
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New Process Integration of Sequential Phosphorus-Doped Silicon for Trench Field Plate Power MOSFETs.In: IEEE Transactions on Semiconductor Manufacturing, Jg. 34 (2021-08-01), Heft 3, S. 317-322Online academicJournalZugriff:
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In: IEEE Transactions on Semiconductor Manufacturing, Jg. 29 (2016-08-01), Heft 3, S. 193-200Online academicJournalZugriff:
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In: IEEE Transactions on Knowledge & Data Engineering, Jg. 34 (2022-08-01), Heft 8, S. 3597-3610Online academicJournalZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 69 (2022-09-01), Heft 9, S. 5316-5323Online academicJournalZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 69 (2022-09-01), Heft 9, S. 5382-5385Online academicJournalZugriff:
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In: IEEE Transactions on Industry Applications, Jg. 56 (2020-05-01), Heft 3, S. 2828-2839Online academicJournalZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 61 (2014-08-01), Heft 4, S. 1510-1515Online academicJournalZugriff:
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In: IEEE Spectrum, Jg. 59 (2022-07-01), Heft 7, S. 28-46Online serialPeriodicalZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 60 (2013-11-01), Heft 11, S. 3807-3813Online academicJournalZugriff:
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In: IEEE Transactions on Reliability, Jg. 67 (2018-09-01), Heft 3, S. 1084-1095Online academicJournalZugriff:
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In: IEEE Transactions on Power Electronics, Jg. 36 (2021-07-01), Heft 7, S. 8308-8324Online academicJournalZugriff:
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In: IEEE Transactions on Instrumentation & Measurement, Jg. 70 (2021-07-01), S. 1-11Online academicJournalZugriff:
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In: IEEE Transactions on Instrumentation & Measurement, Jg. 70 (2021), S. 1-11Online academicJournalZugriff:
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In: IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems, Jg. 39 (2020-11-01), Heft 11, S. 3239-3249Online academicJournalZugriff: