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Weniger Treffer
Art der Quelle
Thema
- engineered materials, dielectrics and plasmas 3 Treffer
- mocvd 3 Treffer
- photonics and electrooptics 3 Treffer
- chemical vapor deposition 2 Treffer
- temperature distribution 2 Treffer
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25 weitere Werte:
- atomic layer deposition 1 Treffer
- bipolar transistors 1 Treffer
- energy measurement 1 Treffer
- epitaxial growth 1 Treffer
- gallium nitride 1 Treffer
- heterojunction bipolar transistors 1 Treffer
- high speed optical techniques 1 Treffer
- hydrogen 1 Treffer
- impurities 1 Treffer
- indium gallium arsenide 1 Treffer
- indium phosphide 1 Treffer
- lattices 1 Treffer
- optical microscopy 1 Treffer
- optical surface waves 1 Treffer
- organic chemicals 1 Treffer
- organic materials 1 Treffer
- photonic band gap 1 Treffer
- p-n junctions 1 Treffer
- reflection 1 Treffer
- semiconductor device doping 1 Treffer
- sputtering 1 Treffer
- steel 1 Treffer
- surface morphology 1 Treffer
- temperature 1 Treffer
- transistors 1 Treffer
Publikation
- 1998 conference on optoelectronic and microelectronic materials and devices. proceedings (cat. no.98ex140), optoelectronic and microelectronic materials devices, 1998. proceedings. 1998 conference on, optoelectronic and microelectronic materials and devices 1 Treffer
- 2008 ieee photonicsglobal@singapore, photonicsglobal@singapore, 2008. ipgc 2008. ieee 1 Treffer
- ieee electron device letters, electron device letters, ieee, ieee electron device lett. 1 Treffer
- seventh international conference on indium phosphide and related materials, indium phosphide and related materials, 1995. conference proceedings., seventh international conference on, indium phosphide and related materials 1 Treffer
Inhaltsanbieter
4 Treffer
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In: Seventh International Conference on Indium Phosphide and Related Materials, 1995, S. 144-147Online KonferenzZugriff:
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In: 2008 IEEE PhotonicsGlobal@Singapore, 2008-12-01, S. 1Online KonferenzZugriff:
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In: 1998 Conference on Optoelectronic and Microelectronic Materials and Devices. Proceedings (Cat. No.98EX140), 1998, S. 464-467Online KonferenzZugriff:
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In: IEEE Electron Device Letters, Jg. 9 (1988-09-01), Heft 9, S. 442-443Online academicJournalZugriff: