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In: ISSN: 1996-1944 ; Materials ; https://hal.science/hal-03813119 ; Materials, 2022, 15 (12), pp.4070 (10). ⟨10.3390/ma15124070⟩, 2022Online academicJournalZugriff:
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In: ISSN: 1996-1944 ; Materials ; https://hal.science/hal-03813037 ; Materials, 2022, 15 (12), pp.4070 (10). ⟨10.3390/ma15124070⟩, 2022Online academicJournalZugriff:
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In: ISSN: 1996-1944 ; Materials ; https://hal.science/hal-03813119 ; Materials, 2022, 15 (12), pp.4070 (10). ⟨10.3390/ma15124070⟩, 2022Online academicJournalZugriff:
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In: ESREF 2023 - 34th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis ; https://hal.science/hal-04094354 ; ESREF 2023 - 34th European Symposium on Reliability of Electron Devices, 2023Online KonferenzZugriff:
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In: Conference on Radiation Effects on Components and Systems (RADECS 2023) ; https://hal.science/hal-04157135 ; Conference on Radiation Effects on Components and Systems (RADECS 2023), Sep 2023, Toulouse, France, 2023KonferenzZugriff:
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In: European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2023) ; https://hal.science/hal-04157172 ; European Symposium on Reliability of Electron Devices, 2023KonferenzZugriff:
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In: ESREF 2023 - 34th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis ; https://hal.science/hal-04094354 ; ESREF 2023 - 34th European Symposium on Reliability of Electron Devices, 2023Online KonferenzZugriff:
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In: RADECS2023 Conference Proceedings ; RADECS 2023 - Conference on Radiation Effects on Components and Systems (RADECS 2023) ; https://hal.science/hal-04157129 ; RADECS 2023 - Conference on Radiation Effects on Components and Systems (RADECS 2023), Sep 2023, Toulouse, France ; https://radecs2023.com/, 2023KonferenzZugriff:
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In: Conference on Radiation Effects on Components and Systems (RADECS 2023) ; https://hal.science/hal-04157135 ; Conference on Radiation Effects on Components and Systems (RADECS 2023), Sep 2023, Toulouse, France, 2023KonferenzZugriff:
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In: European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2023) ; https://hal.science/hal-04157172 ; European Symposium on Reliability of Electron Devices, 2023KonferenzZugriff:
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In: RADECS2023 Conference Proceedings ; RADECS 2023 - Conference on Radiation Effects on Components and Systems (RADECS 2023) ; https://hal.science/hal-04157129 ; RADECS 2023 - Conference on Radiation Effects on Components and Systems (RADECS 2023), Sep 2023, Toulouse, France ; https://radecs2023.com/, 2023KonferenzZugriff:
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In: IEEE Latin American Test Symposium (LATS 2024) ; https://hal.science/hal-04564652 ; IEEE Latin American Test Symposium (LATS 2024), Apr 2024, Maceio, Brazil ; https://cas.polito.it/LATS2024/, 2024Online KonferenzZugriff:
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In: 25th IEEE Latin American Test Symposium (LATS 2024) ; https://hal.science/hal-04513585 ; 25th IEEE Latin American Test Symposium (LATS 2024), Apr 2024, Maceio (Brazil), 2024Online KonferenzZugriff:
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In: International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS 2024) ; https://hal.science/hal-04513560 ; International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS 2024), Apr 2024, Kielce, Poland, 2024Online KonferenzZugriff:
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In: IEEE Latin American Test Symposium (LATS 2024) ; https://hal.science/hal-04564652 ; IEEE Latin American Test Symposium (LATS 2024), Apr 2024, Maceio, Brazil ; https://cas.polito.it/LATS2024/, 2024Online KonferenzZugriff:
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In: IEEE Latin American Test Symposium (LATS 2024) ; https://hal.science/hal-04564652 ; IEEE Latin American Test Symposium (LATS 2024), Apr 2024, Maceio, Brazil ; https://cas.polito.it/LATS2024/, 2024Online KonferenzZugriff:
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In: IEEE Latin American Test Symposium (LATS 2024) ; https://hal.science/hal-04564652 ; IEEE Latin American Test Symposium (LATS 2024), Apr 2024, Maceio, Brazil ; https://cas.polito.it/LATS2024/, 2024Online KonferenzZugriff:
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In: IEEE International Symposium on Hardware Oriented Security and Trust (HOST 2024) ; https://hal.science/hal-04521587 ; IEEE International Symposium on Hardware Oriented Security and Trust (HOST 2024), May 2024, Washington, DC, United States ; http://www.hostsymposium.org/, 2024Online KonferenzZugriff:
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In: 29th IEEE European Test Symposium (ETS 2024) ; https://hal.science/hal-04532564 ; 29th IEEE European Test Symposium (ETS 2024), May 2024, The Hague, Netherlands ; IEEELink, 2024Online KonferenzZugriff:
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In: IEEE International Symposium on Hardware Oriented Security and Trust (HOST 2024) ; https://hal.science/hal-04521587 ; IEEE International Symposium on Hardware Oriented Security and Trust (HOST 2024), May 2024, Washington, DC, United States ; http://www.hostsymposium.org/, 2024Online KonferenzZugriff: