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- frontiers in optics 2022 ; frontiers in optics ; https://hal.science/hal-04257310 ; frontiers in optics, oct 2022, rochester, united states. ⟨10.1364/fio.2022.jw5a.69⟩ 6 Treffer
- avs 17th international conference on atomic layer deposition ; https://hal.science/hal-01701467 ; avs 17th international conference on atomic layer deposition, jan 2017, denver, united states 5 Treffer
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- controlled release society ; https://hal.science/hal-03472797 ; controlled release society, jun 2020, las vegas, united states 4 Treffer
- 2015 s3s proceedings ; 2015 ieee soi-3d-subthreshold microelectronics technology unified conference (s3s) ; https://hal.science/hal-02004218 ; 2015 ieee soi-3d-subthreshold microelectronics technology unified conference (s3s), oct 2015, rohnert park, united states. pp.9a.5, ⟨10.1109/s3s.2015.7333547⟩ 3 Treffer
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10 weitere Werte:
- ieee/rsj international conference on intelligent robots and systems 3 Treffer
- international frequency control symposium and european frequency and time forum ; https://hal.science/hal-02868358 ; international frequency control symposium and european frequency and time forum, apr 2015, denver, united states 3 Treffer
- microtas 2021 ; https://laas.hal.science/hal-03514431 ; microtas 2021, amy e. herr, joel voldman, oct 2021, palm springs, united states ; https://microtas2021.org 3 Treffer
- microtas 2021 ; https://laas.hal.science/hal-03514467 ; microtas 2021, oct 2021, palm spring, united states. , microtas 2021, 2021, the 25th international conference on miniaturized systems for chemistry and life sciences ; https://microtas2021.org 3 Treffer
- aip-conference-proceedings.application of accelerators in research and industry. fourteenth international conference ; https://hal.science/hal-00008730 ; aip-conference-proceedings.application of accelerators in research and industry. fourteenth international conference, 1997, denton, tx, united states. pp.745-8 2 Treffer
- ieee sensors 2022, session invited journal papers ; https://hal.science/hal-04483041 ; ieee sensors 2022, session invited journal papers, oct 2022, dallas, texas, united states 2 Treffer
- international symposium on very large scale integration ; isvlsi: international symposium on very large scale integration 2 Treffer
- nanotech 2012 technical proceedings of the 2012 nsti nanotechnology conference and expo, ; nanotech 2012 nsti nanotechnology conference and expo ; https://hal.science/hal-00759398 ; nanotech 2012 nsti nanotechnology conference and expo, jun 2012, santa clara, california, united states. pp.223-226 2 Treffer
- materials research society meeting ; https://hal.science/hal-03456172 ; materials research society meeting, nov 2021, boston, united states 1 Treffer
- technical proceedings of the 2005 nsti nanotechnology conference and trade show ; https://hal.science/hal-00009100 ; technical proceedings of the 2005 nsti nanotechnology conference and trade show, 2005, anaheim, ca, united states. pp.375 - 378 1 Treffer
Sprache
Geographischer Bezug
Inhaltsanbieter
313 Treffer
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In: 2015 S3S Proceedings ; 2015 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) ; https://hal.science/hal-02004218 ; 2015 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S), Oct 2015, Rohnert Park, United States. pp.9a.5, ⟨10.1109/S3S.2015.7333547⟩, 2015KonferenzZugriff:
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In: 2015 S3S Proceedings ; 2015 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) ; https://hal.science/hal-02004218 ; 2015 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S), Oct 2015, Rohnert Park, United States. pp.9a.5, ⟨10.1109/S3S.2015.7333547⟩, 2015KonferenzZugriff:
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In: 2015 S3S Proceedings ; 2015 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) ; https://hal.science/hal-02004218 ; 2015 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S), Oct 2015, Rohnert Park, United States. pp.9a.5, ⟨10.1109/S3S.2015.7333547⟩, 2015KonferenzZugriff:
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In: 2015 S3S Proceedings ; 2015 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) ; https://hal.archives-ouvertes.fr/hal-02004218 ; 2015 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S), Oct 2015, Rohnert Park, United States. pp.9a.5, ⟨10.1109/S3S.2015.7333547⟩, 2015KonferenzZugriff:
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In: 2015 S3S Proceedings ; 2015 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) ; https://hal.science/hal-02004218 ; 2015 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S), Oct 2015, Rohnert Park, United States. pp.9a.5, ⟨10.1109/S3S.2015.7333547⟩, 2015KonferenzZugriff:
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In: 2018 IEEE Symposium on VLSI Technology ; https://hal.science/hal-02047342 ; 2018 IEEE Symposium on VLSI Technology, Jun 2018, Honolulu, United States. pp.97-98, 2018KonferenzZugriff:
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In: 2018 IEEE Symposium on VLSI Technology ; https://hal.science/hal-02047342 ; 2018 IEEE Symposium on VLSI Technology, Jun 2018, Honolulu, United States. pp.97-98, 2018KonferenzZugriff:
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In: 2018 IEEE Symposium on VLSI Technology ; https://hal.science/hal-02047342 ; 2018 IEEE Symposium on VLSI Technology, Jun 2018, Honolulu, United States. pp.97-98, 2018KonferenzZugriff:
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In: 2018 IEEE Symposium on VLSI Technology ; https://hal.science/hal-02047342 ; 2018 IEEE Symposium on VLSI Technology, Jun 2018, Honolulu, United States. pp.97-98, 2018KonferenzZugriff:
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In: 2018 IEEE Symposium on VLSI Technology ; https://hal.science/hal-02047342 ; 2018 IEEE Symposium on VLSI Technology, Jun 2018, Honolulu, United States. pp.97-98, 2018KonferenzZugriff:
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In: 2018 IEEE Symposium on VLSI Technology ; https://hal.archives-ouvertes.fr/hal-02047342 ; 2018 IEEE Symposium on VLSI Technology, Jun 2018, Honolulu, United States. pp.97-98, 2018KonferenzZugriff:
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In: International Symposium on Very Large Scale Integration ; ISVLSI: International Symposium on Very Large Scale Integration, 2016KonferenzZugriff:
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In: International Symposium on Very Large Scale Integration ; ISVLSI: International Symposium on Very Large Scale Integration, 2016KonferenzZugriff:
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In: 2015 S3S Proceedings ; 2015 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) ; https://hal.science/hal-02004284 ; 2015 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S), Oct 2015, Rohnert Park, United States. pp.10a.3, ⟨10.1109/S3S.2015.7333482⟩, 2015KonferenzZugriff:
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In: 2015 S3S Proceedings ; 2015 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) ; https://hal.science/hal-02004284 ; 2015 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S), Oct 2015, Rohnert Park, United States. pp.10a.3, ⟨10.1109/S3S.2015.7333482⟩, 2015KonferenzZugriff:
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In: 2015 S3S Proceedings ; 2015 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) ; https://hal.archives-ouvertes.fr/hal-02004284 ; 2015 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S), Oct 2015, Rohnert Park, United States. pp.10a.3, ⟨10.1109/S3S.2015.7333482⟩, 2015KonferenzZugriff:
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UTBB FD-SOI front- and back-gate coupling aware random telegraph signal impact analysis on a 6T SRAMIn: 2014 S3S Proceedings ; 2014 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) ; https://hal.univ-grenoble-alpes.fr/hal-02049387 ; 2014 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S), Oct 2014, Millbrae, United States. pp.7a.3, ⟨10.1109/S3S.2014.7028222⟩, 2014KonferenzZugriff:
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UTBB FD-SOI front- and back-gate coupling aware random telegraph signal impact analysis on a 6T SRAMIn: 2014 S3S Proceedings ; 2014 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) ; https://hal.univ-grenoble-alpes.fr/hal-02049387 ; 2014 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S), Oct 2014, Millbrae, United States. pp.7a.3, ⟨10.1109/S3S.2014.7028222⟩, 2014KonferenzZugriff:
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UTBB FD-SOI front- and back-gate coupling aware random telegraph signal impact analysis on a 6T SRAMIn: 2014 S3S Proceedings ; 2014 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) ; https://hal.univ-grenoble-alpes.fr/hal-02049387 ; 2014 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S), Oct 2014, Millbrae, United States. pp.7a.3, ⟨10.1109/S3S.2014.7028222⟩, 2014KonferenzZugriff:
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UTBB FD-SOI front- and back-gate coupling aware random telegraph signal impact analysis on a 6T SRAMIn: 2014 S3S Proceedings ; 2014 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) ; https://hal.univ-grenoble-alpes.fr/hal-02049387 ; 2014 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S), Oct 2014, Millbrae, United States. pp.7a.3, ⟨10.1109/S3S.2014.7028222⟩, 2014KonferenzZugriff: