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45 weitere Werte:
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- issn: 0257-8972 60 Treffer
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45 weitere Werte:
- issn: 2470-0045 29 Treffer
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- issn: 0953-8984 ; eissn: 1361-648x 20 Treffer
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- issn: 0306-2619 ; applied energy ; https://cea.hal.science/cea-01846859 ; applied energy, 2016, 164, pp.284-293. ⟨10.1016/j.apenergy.2015.11.060⟩ 12 Treffer
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- issn: 1629-4475 11 Treffer
- issn: 0094-243x 10 Treffer
- issn: 0925-3467 10 Treffer
- issn: 1474-6670 10 Treffer
- issn: 1866-9565 ; archaeological and anthropological sciences ; https://hal.science/hal-01155304 ; archaeological and anthropological sciences, 2015, 8, pp.10.1007/s12520-015-0250-7. ⟨10.1007/s12520-015-0250-7⟩ ; http://www.springer.com/de/ 10 Treffer
- issn: 1254-7867 9 Treffer
- issn: 1359-8368 ; eissn: 1879-1069 9 Treffer
- issn: 1944-8244 9 Treffer
- issn: 1960-1360 9 Treffer
- issn: 2045-2322 9 Treffer
- issn: 2271-3646 9 Treffer
- issn: 0030-770x 8 Treffer
- issn: 0031-9007 8 Treffer
- issn: 0954-4119 8 Treffer
- issn: 0955-2219 8 Treffer
- issn: 1359-4311 8 Treffer
- issn: 1615-6846 8 Treffer
- issn: 0091-3286 7 Treffer
- issn: 0360-5442 7 Treffer
- issn: 0885-3010 7 Treffer
- issn: 0921-5093 ; eissn: 1873-4936 7 Treffer
- issn: 1041-1135 ; ieee photonics technology letters ; https://hal.univ-smb.fr/hal-01814491 ; ieee photonics technology letters, 2014, 26 (12), pp.1266 - 1269. ⟨10.1109/lpt.2014.2321099⟩ 7 Treffer
- issn: 1042-346x 7 Treffer
- issn: 1169-7954 7 Treffer
- issn: 1932-7447 7 Treffer
- issn: 2156-4868 ; insight - international council on systems engineering (incose) ; https://hal.univ-lorraine.fr/hal-01522702 ; insight - international council on systems engineering (incose), 2013, 16 (4), pp.21-22. ⟨10.1002/inst.201316421⟩ 7 Treffer
- issn: 2192-8614 ; nanophotonics ; https://hal.science/hal-03997594 ; nanophotonics, in press, 28 p. ⟨10.1515/nanoph-2022-0671⟩ 7 Treffer
- issn: 2257-7777 7 Treffer
- eissn: 1466-8033 ; crystengcomm ; https://hal.science/hal-02237058 ; crystengcomm, 2019, ⟨10.1039/c9ce00562e⟩ 6 Treffer
Sprache
Inhaltsanbieter
1.753 Treffer
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In: ISSN: 0038-1101 ; Solid-State Electronics ; https://hal.science/hal-00994378 ; Solid-State Electronics, 2014, 2014Online academicJournalZugriff:
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In: ISSN: 0038-1101 ; Solid-State Electronics ; https://hal.archives-ouvertes.fr/hal-00994378 ; Solid-State Electronics, Elsevier, 2014, 2014Online academicJournalZugriff:
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In: ISSN: 1369-8001 ; Materials Science in Semiconductor Processing ; https://hal.science/hal-03140498 ; Materials Science in Semiconductor Processing, 2019, 96, pp.41-45. ⟨10.1016/j.mssp.2019.02.025⟩, 2019Online academicJournalZugriff:
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In: ISSN: 1369-8001 ; Materials Science in Semiconductor Processing ; https://hal.science/hal-03140498 ; Materials Science in Semiconductor Processing, 2019, 96, pp.41-45. ⟨10.1016/j.mssp.2019.02.025⟩, 2019Online academicJournalZugriff:
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In: Materials Science in Semiconductor Processing ; https://hal.archives-ouvertes.fr/hal-03140498 ; Materials Science in Semiconductor Processing, 2019, 96, pp.41-45. ⟨10.1016/j.mssp.2019.02.025⟩, 2019Online academicJournalZugriff:
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In: ISSN: 2162-8769 ; ECS Journal of Solid State Science and Technology ; Journal of the electrochemical Society ; the electrochemical Society ; https://hal.science/hal-00994168 ; ECS Journal of Solid State Science and Technology, 2013, pp.q205-q210, 2013Online academicJournalZugriff:
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In: ISSN: 2162-8769 ; ECS Journal of Solid State Science and Technology ; https://hal.science/hal-00994293 ; ECS Journal of Solid State Science and Technology, 2013, pp.q205-q210. ⟨10.1149/2.011311jss⟩, 2013Online academicJournalZugriff:
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In: ISSN: 2162-8769 ; ECS Journal of Solid State Science and Technology ; https://hal.archives-ouvertes.fr/hal-00994293 ; ECS Journal of Solid State Science and Technology, IOP Science, 2013, pp.q205-q210. ⟨10.1149/2.011311jss⟩, 2013Online academicJournalZugriff:
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In: ISSN: 0018-9383 ; IEEE Transactions on Electron Devices ; https://hal.science/hal-03654697 ; IEEE Transactions on Electron Devices, 2014, 61 (3), pp.801-805. ⟨10.1109/TED.2014.2301913⟩, 2014academicJournalZugriff:
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In: ISSN: 0018-9383 ; IEEE Transactions on Electron Devices ; https://hal.science/hal-03654697 ; IEEE Transactions on Electron Devices, 2014, 61 (3), pp.801-805. ⟨10.1109/TED.2014.2301913⟩, 2014academicJournalZugriff:
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In: ISSN: 0018-9383 ; IEEE Transactions on Electron Devices ; https://hal.science/hal-03654697 ; IEEE Transactions on Electron Devices, 2014, 61 (3), pp.801-805. ⟨10.1109/TED.2014.2301913⟩, 2014academicJournalZugriff:
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In: ISSN: 0026-2714, 2016academicJournalZugriff:
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In: ISSN: 0026-2714, 2016academicJournalZugriff:
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In: ISSN: 0026-2714 ; Microelectronics Reliability ; https://hal.archives-ouvertes.fr/hal-01977447 ; Microelectronics Reliability, Elsevier, 2016, 64, pp.158-162, 2016academicJournalZugriff:
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EIS study to analyse the influence of mechanical compression on the global PEM fuel cell performanceIn: ISSN: 0360-3199, 2024Online academicJournalZugriff:
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EIS study to analyse the influence of mechanical compression on the global PEM fuel cell performanceIn: ISSN: 0360-3199, 2024Online academicJournalZugriff:
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In: ISSN: 0360-3199, 2024Online academicJournalZugriff:
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EIS study to analyse the influence of mechanical compression on the global PEM fuel cell performanceIn: ISSN: 0360-3199, 2024Online academicJournalZugriff:
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In: ISSN: 1424-8220 ; Sensors ; https://u-bourgogne.hal.science/hal-04421861 ; Sensors, 2024, 2024Online academicJournalZugriff:
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In: ISSN: 0360-3199, 2024Online academicJournalZugriff: