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45 weitere Werte:
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Verlag
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- issn: 0003-6951 8 Treffer
- issn: 0021-8898 6 Treffer
- issn: 0031-9007 5 Treffer
- issn: 1359-6454 ; acta materialia ; https://hal.in2p3.fr/in2p3-01270645 ; acta materialia, 2016, 103, pp.665-671. ⟨10.1016/j.actamat.2015.10.046⟩ 5 Treffer
- issn: 1098-0121 ; eissn: 1550-235x 4 Treffer
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5 weitere Werte:
- issn: 0021-8979 3 Treffer
- issn: 1530-6984 3 Treffer
- https://theses.hal.science/tel-02060034 ; science des materiaux [cond-mat.mtrl-sci]. universite toulouse iii paul sabatier (ut3 paul sabatier), 2019 1 Treffer
- materials research society symposia proceedings ; https://hal.science/hal-00311374 ; materials research society symposia proceedings, 2007, 1026, pp.1026-c22-04. ⟨10.1557/proc-1026-c22-04⟩ 1 Treffer
- proceedings of science (pos) ; the european physical society conference on high energy physics (eps-hep2017) ; https://cea.hal.science/cea-02060804 ; the european physical society conference on high energy physics (eps-hep2017), istituto nazionale di fisica nucleare (infn); department of physics and astronomy of the university of padova, jul 2017, venice, italy. pp.516, ⟨10.22323/1.314.0516⟩ ; https://pos.sissa.it/314/516/pdf 1 Treffer
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55 Treffer
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In: ISSN: 0021-8898, 2022Online academicJournalZugriff:
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In: ISSN: 0021-8898, 2022Online academicJournalZugriff:
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In: https://hal.science/tel-04508877 ; Materials Science [cond-mat.mtrl-sci]. Université Grenoble Alpes, 2023, 2023Online HochschulschriftZugriff:
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In: ISSN: 0003-6951, 2019Online academicJournalZugriff:
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In: X-Ray Nanoimaging: Instruments and Methods III ; SPIE Proceedings ; SPIE Optics and Photonics ; https://hal.science/hal-03751749 ; SPIE Optics and Photonics, Aug 2017, San Diego, CA, United States. pp.103890F, ⟨10.1117/12.2275739⟩, 2017Online KonferenzZugriff:
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In: X-Ray Nanoimaging: Instruments and Methods III ; SPIE Proceedings ; SPIE Optics and Photonics ; https://hal.science/hal-03751749 ; SPIE Optics and Photonics, Aug 2017, San Diego, CA, United States. pp.103890F, ⟨10.1117/12.2275739⟩, 2017Online KonferenzZugriff:
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In: X-Ray Nanoimaging: Instruments and Methods III ; SPIE Proceedings ; SPIE Optics and Photonics ; https://hal.science/hal-03751749 ; SPIE Optics and Photonics, Aug 2017, San Diego, CA, United States. pp.103890F, ⟨10.1117/12.2275739⟩, 2017Online KonferenzZugriff:
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In: ISSN: 0003-6951, 2022Online academicJournalZugriff:
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In: ISSN: 0003-6951, 2022Online academicJournalZugriff:
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