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In: Proc. IEEE International Microwave Theory and Techniques Symposium, MTT-S 2010 ; https://hal.science/hal-00604344 ; Proc. IEEE International Microwave Theory and Techniques Symposium, 2010KonferenzZugriff:
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In: Proc. IEEE International Microwave Theory and Techniques Symposium, MTT-S 2010 ; https://hal.science/hal-00604344 ; Proc. IEEE International Microwave Theory and Techniques Symposium, 2010KonferenzZugriff:
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In: Proc. IEEE International Microwave Theory and Techniques Symposium, MTT-S 2010 ; https://hal.science/hal-00604344 ; Proc. IEEE International Microwave Theory and Techniques Symposium, 2010KonferenzZugriff:
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In: Proc. IEEE International Microwave Theory and Techniques Symposium, MTT-S 2010 ; https://hal.archives-ouvertes.fr/hal-00604344 ; Proc. IEEE International Microwave Theory and Techniques Symposium, 2010KonferenzZugriff:
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In: Determination of measurement uncertainties applied to the RCS and the differential RCS of UHF passive RFID tags ; https://hal.science/hal-00602845 ; Determination of measurement uncertainties applied to the RCS and the differential RCS of UHF passive RFID tags, Jun 2009, Charleston, United States, 2009KonferenzZugriff:
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In: Determination of measurement uncertainties applied to the RCS and the differential RCS of UHF passive RFID tags ; https://hal.science/hal-00602845 ; Determination of measurement uncertainties applied to the RCS and the differential RCS of UHF passive RFID tags, Jun 2009, Charleston, United States, 2009KonferenzZugriff:
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In: Determination of measurement uncertainties applied to the RCS and the differential RCS of UHF passive RFID tags ; https://hal.archives-ouvertes.fr/hal-00602845 ; Determination of measurement uncertainties applied to the RCS and the differential RCS of UHF passive RFID tags, Jun 2009, Charleston, United States, 2009KonferenzZugriff: