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Weniger Treffer
Art der Quelle
Thema
- atomic layer deposition 3 Treffer
- gallium nitride 3 Treffer
- substrates 3 Treffer
- components, circuits, devices and systems 2 Treffer
- low temperature growth 2 Treffer
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38 weitere Werte:
- plasma temperature 2 Treffer
- power, energy and industry applications 2 Treffer
- temperature 2 Treffer
- aerospace 1 Treffer
- atoms 1 Treffer
- bioengineering 1 Treffer
- buffer layers 1 Treffer
- cathodes 1 Treffer
- communication, networking and broadcast technologies 1 Treffer
- deposition 1 Treffer
- different substrates 1 Treffer
- electrodes 1 Treffer
- electron sources 1 Treffer
- engineered materials, dielectrics and plasmas 1 Treffer
- epitaxial growth 1 Treffer
- fields, waves and electromagnetics 1 Treffer
- film growth 1 Treffer
- films 1 Treffer
- gallium alloys 1 Treffer
- grazing incidence x-ray diffraction 1 Treffer
- heteroepitaxy 1 Treffer
- hollow cathodes 1 Treffer
- ingan 1 Treffer
- low temperature 1 Treffer
- mocvd 1 Treffer
- nanotechnology 1 Treffer
- optical properties 1 Treffer
- pulsed laser deposition 1 Treffer
- refractive index 1 Treffer
- signal processing and analysis 1 Treffer
- structural and optical properties 1 Treffer
- substrate temperature 1 Treffer
- surface treatment 1 Treffer
- temperature measurement 1 Treffer
- thin films 1 Treffer
- trimethylgallium 1 Treffer
- x ray diffraction 1 Treffer
- x ray photoelectron spectroscopy 1 Treffer
Verlag
Publikation
- 2016 ieee 36th international conference on electronics and nanotechnology (elnano), electronics and nanotechnology (elnano), 2016 ieee 36th international conference on 1 Treffer
- 2017 ieee 5th workshop on wide bandgap power devices and applications (wipda), wide bandgap power devices and applications (wipda), 2017 ieee 5th workshop on 1 Treffer
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Inhaltsanbieter
3 Treffer
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In: 2016 IEEE 36th International Conference on Electronics and Nanotechnology (ELNANO), 2016-04-01, S. 132-134Online KonferenzZugriff:
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In: 2017 IEEE 5th Workshop on Wide Bandgap Power Devices and Applications (WiPDA), 2017-10-01, S. 48-54Online KonferenzZugriff:
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2002Online KonferenzZugriff: