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In: ICBSP, 2022, S. 52-57KonferenzZugriff:
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Dieser Titel kann aus lizenzrechtlichen Gründen nur im Campusnetz oder nach Anmeldung angezeigt werden!KonferenzZugriff:
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In: 2011 IEEE Applied Electromagnetics Conference (AEMC), 2011-12-01, S. 1-7Online KonferenzZugriff:
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In: Waste News, Jg. 6 (2000-06-26), Heft 6, S. 16Online serialPeriodicalZugriff:
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In: Publishers Weekly, Jg. 250 (2003-05-19), Heft 20, S. 24Online serialPeriodicalZugriff:
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In: 2022 IEEE International Conference on Rebooting Computing (ICRC), 2022-12-01, S. 36-44Online KonferenzZugriff:
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Dieser Titel kann aus lizenzrechtlichen Gründen nur im Campusnetz oder nach Anmeldung angezeigt werden!serialPeriodicalZugriff:
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In: Publishers Weekly, Jg. 264 (2017-07-17), Heft 29, S. 6Online serialPeriodicalZugriff:
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In: 2019 China Semiconductor Technology International Conference (CSTIC), 2019-03-01, S. 1-3Online KonferenzZugriff:
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In: Publishers Weekly, Jg. 267 (2020-02-10), Heft 6, S. 10-11Online serialPeriodicalZugriff:
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In: Publishers Weekly (Online), 2003-01-02, S. 1-1Online serialPeriodicalZugriff:
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In: Proceedings. 10th IEEE International Symposium on Modeling, Analysis and Simulation of Computer and Telecommunications Systems, 2002, S. 267-276Online KonferenzZugriff:
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In: 1999 IEEE MTT-S International Microwave Symposium Digest (Cat. No.99CH36282), Jg. 1 (1999), S. 145-148Online KonferenzZugriff:
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In: Publishers Weekly, Jg. 269 (2022-04-04), Heft 14, S. 14-15Online serialPeriodicalZugriff:
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In: 5th International Electronic Conference on Medicinal Chemistry ; https://u-picardie.hal.science/hal-04164246 ; 5th International Electronic Conference on Medicinal Chemistry, Nov 2019, Sciforum.net, France. pp.6324, ⟨10.3390/ECMC2019-06324⟩, 2019KonferenzZugriff:
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In: Proceedings of 2001 International Symposium on Electrical Insulating Materials (ISEIM 2001). 2001 Asian Conference on Electrical Insulating Diagnosis (ACEID 2001). 33rd Symposium on Electrical and Ele, 2001, S. 701-704Online KonferenzZugriff:
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In: Proceedings of the 6th International Conference on Properties and Applications of Dielectric Materials (Cat. No.00CH36347), Jg. 2 (2000), S. 749-752Online KonferenzZugriff:
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In: Proceedings of 1995 IEEE International Computer Performance and Dependability Symposium, 1995, S. 82-91Online KonferenzZugriff:
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In: Publishers Weekly, Jg. 268 (2021-01-18), Heft 3, S. 10Online serialPeriodicalZugriff: