Suchergebnisse
Katalog
Aufsätze & mehr
Suchmaske
Suchergebnisse einschränken oder erweitern
Aktive Suchfilter
Weniger Treffer
Art der Quelle
Thema
- [spi]engineering sciences [physics] 10 Treffer
- [spi.nano]engineering sciences [physics]/micro and nanotechnologies/microelectronics 9 Treffer
- pacs 8542 6 Treffer
- [info.info-ai]computer science [cs]/artificial intelligence [cs.ai] 4 Treffer
- [chim]chemical sciences 3 Treffer
-
24 weitere Werte:
- 500 naturwissenschaften 2 Treffer
- 910 geografie 2 Treffer
- reisen 2 Treffer
- [sdu.stu.gp]sciences of the universe [physics]/earth sciences/geophysics [physics.geo-ph] 1 Treffer
- [sdu.stu.te]sciences of the universe [physics]/earth sciences/tectonics 1 Treffer
- [spi.mat]engineering sciences [physics]/materials 1 Treffer
- anthro-se 1 Treffer
- containers 1 Treffer
- determinism 1 Treffer
- electronic mail 1 Treffer
- fast detection 1 Treffer
- gan 1 Treffer
- geo 1 Treffer
- h2 1 Treffer
- hemt 1 Treffer
- high temperature 1 Treffer
- iaas 1 Treffer
- industrial control systems 1 Treffer
- libraries 1 Treffer
- o2 1 Treffer
- quantification 1 Treffer
- real-time 1 Treffer
- semiconductor device 1 Treffer
- sensors 1 Treffer
Sprache
Geographischer Bezug
Inhaltsanbieter
32 Treffer
-
In: 2007 American Control Conference, New York, NY, July 11-13, 2007; (2007)BuchZugriff:
-
2007Online BuchZugriff:
-
In: 2020 IEEE Symposium on VLSI Technology ; https://hal.archives-ouvertes.fr/hal-03178715 ; 2020 IEEE Symposium on VLSI Technology, Jun 2020, Honolulu, IEEE, pp.1-2, 2020, ⟨10.1109/VLSITechnology18217.2020.9265100⟩; (2020)BuchZugriff:
-
In: https://hal.science/hal-02107984 ; IEEE, pp.1-3, 2019, ⟨10.1109/ISOEN.2017.7968845⟩; (2019)BuchZugriff:
-
In: https://hal.science/hal-02107984 ; IEEE, pp.1-3, 2019, ⟨10.1109/ISOEN.2017.7968845⟩; (2019)BuchZugriff:
-
In: https://hal.archives-ouvertes.fr/hal-02107984 ; IEEE, pp.1-3, 2019; (2019)BuchZugriff:
-
In: IGARSS 2018 - 2018 IEEE International Geoscience and Remote Sensing Symposium ; https://hal.archives-ouvertes.fr/hal-02155544 ; IGARSS 2018 - 2018 IEEE International Geoscience and Remote Sensing Symposium, Jul 2018, Valencia, France. IEEE, pp.2212-2215, 2018; (2018)BuchZugriff:
-
In: 2019 IEEE SENSORS ; https://hal.archives-ouvertes.fr/hal-02451449 ; 2019 IEEE SENSORS, Oct 2019, Montreal, Canada. IEEE, pp.1-4, 2020, Proceedings of 18th IEEE Sensors Conference, IEEE SENSORS 2019, ⟨10.1109/SENSORS43011.2019.8956568⟩; (2020)BuchZugriff:
-
In: https://hal.science/hal-02080501 ; ieee, 19 - Issue 1, pp.3-5, 2019, IEEE Transactions on Device and Materials Reliability; (2019)BuchZugriff:
-
In: https://hal.science/hal-02650720 ; ieee, 2019, 9781728117577; (2019)Online BuchZugriff:
-
In: 2019 IEEE 69th Electronic Components and Technology Conference (ECTC) ; https://hal.archives-ouvertes.fr/hal-02453574 ; 2019 IEEE 69th Electronic Components and Technology Conference (ECTC), May 2019, Las Vegas, IEEE, pp.2117-2125, 2019, ⟨10.1109/ECTC.2019.00-30⟩; (2019)BuchZugriff:
-
In: https://hal.archives-ouvertes.fr/hal-02650720 ; ieee, 2019, 9781728117577; (2019)Online BuchZugriff:
-
In: https://hal.archives-ouvertes.fr/hal-02080501 ; ieee, 19 - Issue 1, pp.3-5, 2019, IEEE Transactions on Device and Materials Reliability; (2019)BuchZugriff:
-
In: 2019 IEEE 69th Electronic Components and Technology Conference (ECTC) ; https://hal.archives-ouvertes.fr/hal-02453586 ; 2019 IEEE 69th Electronic Components and Technology Conference (ECTC), May 2019, Las Vegas, IEEE, pp.1396-1404, 2019, ⟨10.1109/ECTC.2019.00215⟩; (2019)BuchZugriff:
-
In: 2019 IEEE 69th Electronic Components and Technology Conference (ECTC) ; https://hal.archives-ouvertes.fr/hal-02453570 ; 2019 IEEE 69th Electronic Components and Technology Conference (ECTC), May 2019, Las Vegas, United States. IEEE, pp.467-473, 2019, ⟨10.1109/ECTC.2019.00077⟩; (2019)BuchZugriff:
-
In: 2018 IEEE 68th Electronic Components and Technology Conference (ECTC) ; https://hal.archives-ouvertes.fr/hal-02453593 ; 2018 IEEE 68th Electronic Components and Technology Conference (ECTC), May 2018, San Diego, France. IEEE, pp.2055-2060, 2018, ⟨10.1109/ECTC.2018.00308⟩; (2018)BuchZugriff:
-
In: 2018 Pan Pacific Microelectronics Symposium (Pan Pacific) ; https://hal.archives-ouvertes.fr/hal-02453595 ; 2018 Pan Pacific Microelectronics Symposium (Pan Pacific), Feb 2018, Waimea, IEEE, pp.1-8, 2018, ⟨10.23919/PanPacific.2018.8319015⟩; (2018)BuchZugriff: