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- pacs 85.42 360 Treffer
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45 weitere Werte:
- [spi.opti]engineering sciences [physics]/optics / photonic 66 Treffer
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- soi 48 Treffer
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- fdsoi 35 Treffer
- mosfet 32 Treffer
- [info.info-cr]computer science [cs]/cryptography and security [cs.cr] 31 Treffer
- [phys]physics [physics] 31 Treffer
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- [phys.qphy]physics [physics]/quantum physics [quant-ph] 30 Treffer
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- [phys.phys.phys-data-an]physics [physics]/physics [physics]/data analysis 21 Treffer
- statistics and probability [physics.data-an] 21 Treffer
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- [phys.cond]physics [physics]/condensed matter [cond-mat] 17 Treffer
- artificial neural networks 17 Treffer
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- finfet 16 Treffer
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- pacs: 85.42 16 Treffer
- [phys.phys.phys-optics]physics [physics]/physics [physics]/optics [physics.optics] 15 Treffer
- a2ram 15 Treffer
- gallium nitride 15 Treffer
- logic gates 15 Treffer
- semiconductor device reliability 15 Treffer
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- [info.info-ar]computer science [cs]/hardware architecture [cs.ar] 14 Treffer
- [info.info-ia]computer science [cs]/computer aided engineering 14 Treffer
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- in-memory computing 13 Treffer
- silicon germanium 13 Treffer
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- bimos 12 Treffer
- cmos 12 Treffer
Publikation
- issn: 2169-3536 31 Treffer
- issn: 1549-8328 ; eissn: 1558-0806 26 Treffer
- issn: 2156-3381 9 Treffer
- 2022 ieee international memory workshop (imw) ; https://hal.science/hal-03840618 ; 2022 ieee international memory workshop (imw), may 2022, dresden, france. pp.1-4, ⟨10.1109/imw52921.2022.9779293⟩ 7 Treffer
- imw 2022 - ieee international memory workshop ; https://cea.hal.science/cea-03707392 ; imw 2022 - ieee international memory workshop, may 2022, dresden, germany. pp.1-4, ⟨10.1109/imw52921.2022.9779253⟩ 7 Treffer
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45 weitere Werte:
- 13th european microwave integrated circuits conference (eumic 2018) ; https://laas.hal.science/hal-02088200 ; 13th european microwave integrated circuits conference (eumic 2018), sep 2018, madrid, spain. pp.17-20, ⟨10.23919/eumic.2018.8539919⟩ 6 Treffer
- ets 2023 - ieee european test symposium ; https://hal.science/hal-04103942 ; ets 2023 - ieee european test symposium, ieee, may 2023, venise, italy. ⟨10.48550/arxiv.2305.03139⟩ ; https://cas.polito.it/ets23/#/ 6 Treffer
- proceedings of 2023 ieee 41st vlsi test symposium (vts) ; ieee vlsi test symposium (vts 2023) ; https://hal.science/hal-04103973 ; ieee vlsi test symposium (vts 2023), ieee, apr 2023, san diego, ca, united states. ⟨10.1109/vts56346.2023.10139932⟩ ; https://tttc-vts.org/public_html/new/2023/ 6 Treffer
- 2017 vlsi-technology technical digest ; 2017 ieee symposium on vlsi technology ; https://hal.science/hal-02050220 ; 2017 ieee symposium on vlsi technology, jun 2017, kyoto, japan. pp.t224-t225, ⟨10.23919/vlsit.2017.7998180⟩ 5 Treffer
- 2019 ieee 16th international conference on group iv photonics (gfp) ; https://hal.univ-grenoble-alpes.fr/hal-02330536 ; 2019 ieee 16th international conference on group iv photonics (gfp), aug 2019, singapore, singapore. pp.1-2, ⟨10.1109/group4.2019.8853923⟩ 5 Treffer
- 21st design, automation & test in europe conference & exhibition ; date 2018 - 21st design, automation and test in europe conference and exhibition ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-01880198 ; date 2018 - 21st design, automation and test in europe conference and exhibition, mar 2018, dresden, germany. pp.937-942, ⟨10.23919/date.2018.8342144⟩ ; https://www.date-conference.com/date18/ 5 Treffer
- esscirc 2021 - ieee 47th european solid state circuits conference (esscirc) ; https://hal.science/hal-03597353 ; esscirc 2021 - ieee 47th european solid state circuits conference (esscirc), sep 2021, grenoble, france. pp.83-86, ⟨10.1109/esscirc53450.2021.9567742⟩ 5 Treffer
- ieee international electron devices meeting 5 Treffer
- international conference on simulation of semiconductor processes and devices 5 Treffer
- issn: 1549-8328 5 Treffer
- issn: 2168-2356 ; ieee design & test ; https://hal.science/hal-03370952 ; ieee design & test, 2022, ieee design & test, 39 (3), pp.117-124. ⟨10.1109/mdat.2021.3117875⟩ 5 Treffer
- 2009 11th international conference on transparent optical networks (icton) ; https://cea.hal.science/cea-01991966 ; 2009 11th international conference on transparent optical networks (icton), jun 2009, ponta delgada, portugal. pp.1-3, ⟨10.1109/icton.2009.5185174⟩ 4 Treffer
- 2018 16th ieee international new circuits and systems conference (newcas) ; https://hal.science/hal-02062005 ; 2018 16th ieee international new circuits and systems conference (newcas), jun 2018, montreal, canada. pp.252-255, ⟨10.1109/newcas.2018.8585644⟩ ; http://newcas2018.org/ 4 Treffer
- 2018 ieee 24th international symposium on on-line testing and robust system design (iolts) ; iolts 2018 - ieee 24th international symposium on on-line testing and robust system design ; https://hal.science/hal-01976583 ; iolts 2018 - ieee 24th international symposium on on-line testing and robust system design, jul 2018, platja d'aro, spain. pp.109-114, ⟨10.1109/iolts.2018.8474226⟩ 4 Treffer
- 2018 ieee nuclear science symposium and medical imaging conference proceedings (nss/mic) ; 2018 ieee nuclear science symposium and medical imaging conference (nss/mic) ; https://hal.science/hal-02530634 ; 2018 ieee nuclear science symposium and medical imaging conference (nss/mic), nov 2018, sydney, france. pp.8824486, ⟨10.1109/nssmic.2018.8824486⟩ 4 Treffer
- 2019 ieee international symposium on defect and fault tolerance in vlsi and nanotechnology systems (dft) ; https://hal.science/hal-02462194 ; 2019 ieee international symposium on defect and fault tolerance in vlsi and nanotechnology systems (dft), oct 2019, noordwijk, netherlands. pp.8138-8143, ⟨10.1109/dft.2019.8875270⟩ 4 Treffer
- 2022 ieee international reliability physics symposium (irps) ; irps 2022 - ieee international reliability physics symposium ; https://hal.science/hal-04442653 ; irps 2022 - ieee international reliability physics symposium, mar 2022, dallas, united states. pp.p8-1-p8-4, ⟨10.1109/irps48227.2022.9764474⟩ ; https://ieeexplore.ieee.org/document/9764474 4 Treffer
- conference on microelectronic test structures (icmts) ; https://hal.univ-grenoble-alpes.fr/hal-02362746 ; conference on microelectronic test structures (icmts), 2019, kita-kyushu, japan. pp.176-179, ⟨10.1109/icmts.2019.8730990⟩ 4 Treffer
- conference proceedings ; https://hal.univ-grenoble-alpes.fr/hal-02353255 ; conference proceedings, 2002, paris, france. pp.565-568, ⟨10.1109/iciprm.2002.1014491⟩ 4 Treffer
- icecs 2023 - 30th ieee international conference on electronics, circuits and systems ; https://cea.hal.science/cea-04455302 ; icecs 2023 - 30th ieee international conference on electronics, circuits and systems, ieee, dec 2023, istanbul, turkey. ⟨10.1109/icecs58634.2023.10382858⟩ ; https://ieeexplore.ieee.org/document/10382858 4 Treffer
- ieee computer society annual symposium on vlsi (isvlsi) ; https://hal.science/hal-01382948 ; ieee computer society annual symposium on vlsi (isvlsi), jul 2016, pittsburgh, united states. pp.134-139, ⟨10.1109/isvlsi.2016.18⟩ ; http://ieeexplore.ieee.org/document/7560186/ 4 Treffer
- ieee international symposium on design and diagnostics of electronic circuits and systems (ddecs 2022) ; https://hal.science/hal-03641285 ; ieee international symposium on design and diagnostics of electronic circuits and systems (ddecs 2022), apr 2022, prague, czech republic. ⟨10.1109/ddecs54261.2022.9770138⟩ ; ieeelink 4 Treffer
- international conference on integrated circuit design and technology (icicdt 2010) ; https://hal.science/hal-04393654 ; international conference on integrated circuit design and technology (icicdt 2010), jun 2010, grenoble, france. pp.220-223, ⟨10.1109/icicdt.2010.5510250⟩ 4 Treffer
- 2009 11th international conference on transparent optical networks (icton) ; https://cea.hal.science/cea-01993631 ; 2009 11th international conference on transparent optical networks (icton), jun 2009, ponta delgada, france. pp.1-3, ⟨10.1109/icton.2009.5185174⟩ 3 Treffer
- 2009 11th international conference on transparent optical networks (icton) ; https://cea.hal.science/cea-01993638 ; 2009 11th international conference on transparent optical networks (icton), jun 2009, ponta delgada, france. pp.1-3 3 Treffer
- 2015 ieee 17th electronics packaging and technology conference (eptc) ; https://cea.hal.science/cea-02156720 ; 2015 ieee 17th electronics packaging and technology conference (eptc), dec 2015, singapore, france. pp.1-3 3 Treffer
- 2015 sispad proceedings ; 2015 international conference on simulation of semiconductor processes and devices (sispad) ; https://hal.univ-grenoble-alpes.fr/hal-02016552 ; 2015 international conference on simulation of semiconductor processes and devices (sispad), sep 2015, washington dc, united states. pp.206-209, ⟨10.1109/sispad.2015.7292295⟩ 3 Treffer
- 2016 16th european conference on radiation and its effects on components and systems (radecs) ; radiation and its effects on components and systems (radecs'16) ; https://hal.science/hal-01524119 ; radiation and its effects on components and systems (radecs'16), sep 2016, bremen, germany. 4 p., ⟨10.1109/radecs.2016.8093179⟩ ; http://www.radecs2016.com/joomla/ 3 Treffer
- 2016 eurosoi-ulis proceedings ; 2016 joint international eurosoi workshop and international conference on ultimate integration on silicon (eurosoi-ulis) ; https://hal.science/hal-02006211 ; 2016 joint international eurosoi workshop and international conference on ultimate integration on silicon (eurosoi-ulis), jan 2016, vienna, austria. pp.174-177, ⟨10.1109/ulis.2016.7440081⟩ 3 Treffer
- 2016 eurosoi-ulis proceedings ; 2016 joint international eurosoi workshop and international conference on ultimate integration on silicon (eurosoi-ulis) ; https://hal.science/hal-02050084 ; 2016 joint international eurosoi workshop and international conference on ultimate integration on silicon (eurosoi-ulis), jan 2016, vienna, austria. pp.135-138, ⟨10.1109/ulis.2016.7440071⟩ 3 Treffer
- 2017 15th ieee international new circuits and systems conference (newcas) ; https://hal.science/hal-01704374 ; 2017 15th ieee international new circuits and systems conference (newcas), jun 2017, strasbourg, france. ⟨10.1109/newcas.2017.8010126⟩ 3 Treffer
- 2017 essderc proceedings ; 2017 essderc - 47th european solid-state device research conference ; https://cea.hal.science/cea-01525266 ; 2017 essderc - 47th european solid-state device research conference, sep 2017, leuven, belgium. pp.144-147, ⟨10.1109/essderc.2017.8066612⟩ 3 Treffer
- 2017 eurosoi-ulis proceedings ; 2017 joint international eurosoi workshop and international conference on ultimate integration on silicon (eurosoi-ulis) ; https://hal.science/hal-02007188 ; 2017 joint international eurosoi workshop and international conference on ultimate integration on silicon (eurosoi-ulis), apr 2017, athens, greece. pp.9-12, ⟨10.1109/ulis.2017.7962579⟩ 3 Treffer
- 2017 eurosoi-ulis proceedings ; 2017 joint international eurosoi workshop and international conference on ultimate integration on silicon (eurosoi-ulis) ; https://hal.univ-grenoble-alpes.fr/hal-01929331 ; 2017 joint international eurosoi workshop and international conference on ultimate integration on silicon (eurosoi-ulis), apr 2017, athens, greece. pp.231-234, ⟨10.1109/ulis.2017.7962570⟩ 3 Treffer
- 2017 eurosoi-ulis proceedings ; 2017 joint international eurosoi workshop and international conference on ultimate integration on silicon (eurosoi-ulis) ; https://hal.univ-grenoble-alpes.fr/hal-01929333 ; 2017 joint international eurosoi workshop and international conference on ultimate integration on silicon (eurosoi-ulis), apr 2017, athens, greece. pp.23-26, ⟨10.1109/ulis.2017.7962591⟩ 3 Treffer
- 2017 iedm technical digest ; 2017 ieee international electron devices meeting (iedm) ; https://hal.science/hal-01959097 ; 2017 ieee international electron devices meeting (iedm), dec 2017, san francisco, united states. pp.32.2.1-32.2.4, ⟨10.1109/iedm.2017.8268484⟩ 3 Treffer
- 2017 iedm technical digest ; 2017 ieee international electron devices meeting (iedm) ; https://hal.science/hal-02050229 ; 2017 ieee international electron devices meeting (iedm), dec 2017, san francisco, united states. pp.7.6.1-7.6.4, ⟨10.1109/iedm.2017.8268348⟩ 3 Treffer
- 2017 ieee 21st workshop on signal and power integrity (spi) ; https://hal.science/hal-01988728 ; 2017 ieee 21st workshop on signal and power integrity (spi), may 2017, lake maggiore, italy. pp.1-4, ⟨10.1109/sapiw.2017.7944026⟩ 3 Treffer
- 2017 irps proceedings ; 2017 ieee international reliability physics symposium (irps) ; https://hal.science/hal-02050205 ; 2017 ieee international reliability physics symposium (irps), apr 2017, monterey, united states. pp.3e-4.1-3e-4.6, ⟨10.1109/irps.2017.7936297⟩ 3 Treffer
- 2017 s3s proceedings ; 2017 ieee soi-3d-subthreshold microelectronics technology unified conference (s3s) ; https://hal.science/hal-01959113 ; 2017 ieee soi-3d-subthreshold microelectronics technology unified conference (s3s), oct 2017, burlingame, ca, united states. pp.24.3, ⟨10.1109/s3s.2017.8309220⟩ 3 Treffer
- 2017 s3s proceedings ; 2017 ieee soi-3d-subthreshold microelectronics technology unified conference (s3s) ; https://hal.science/hal-02050231 ; 2017 ieee soi-3d-subthreshold microelectronics technology unified conference (s3s), oct 2017, burlingame, united states. pp.24.2, ⟨10.1109/s3s.2017.8309219⟩ 3 Treffer
- 2017 s3s proceedings ; 2017 ieee soi-3d-subthreshold microelectronics technology unified conference (s3s) ; https://hal.science/hal-02050233 ; 2017 ieee soi-3d-subthreshold microelectronics technology unified conference (s3s), oct 2017, burlingame, united states. pp.6.4, ⟨10.1109/s3s.2017.8309239⟩ 3 Treffer
- 2017 sispad proceedings ; 2017 international conference on simulation of semiconductor processes and devices (sispad) ; https://hal.science/hal-02007238 ; 2017 international conference on simulation of semiconductor processes and devices (sispad), sep 2017, kamakura, japan. pp.329-332, ⟨10.23919/sispad.2017.8085331⟩ 3 Treffer
- 2018 28th eaeeie annual conference (eaeeie) ; https://hal.science/hal-01995417 ; 2018 28th eaeeie annual conference (eaeeie), sep 2018, reykjavik, iceland. pp.1-5, ⟨10.1109/eaeeie.2018.8534281⟩ 3 Treffer
- 2018 eurosoi-ulis proceedings ; 2018 joint international eurosoi workshop and international conference on ultimate integration on silicon (eurosoi-ulis) ; https://hal.science/hal-02007301 ; 2018 joint international eurosoi workshop and international conference on ultimate integration on silicon (eurosoi-ulis), mar 2018, granada, spain. pp.25-28, ⟨10.1109/ulis.2018.8354725⟩ 3 Treffer
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In: 29th IEEE European Test Symposium (ETS 2024) ; https://hal.science/hal-04532564 ; 29th IEEE European Test Symposium (ETS 2024), May 2024, The Hague, Netherlands ; IEEELink, 2024Online KonferenzZugriff:
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In: 29th IEEE European Test Symposium (ETS 2024) ; https://hal.science/hal-04532564 ; 29th IEEE European Test Symposium (ETS 2024), May 2024, The Hague, Netherlands ; IEEELink, 2024Online KonferenzZugriff:
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In: IEEE Latin American Test Symposium (LATS 2024) ; https://hal.science/hal-04527044 ; IEEE Latin American Test Symposium (LATS 2024), Apr 2024, Maceio, Brazil, 2024Online KonferenzZugriff:
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In: IEEE 24th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems (SiRF 2024) ; https://hal.science/hal-04487746 ; IEEE 24th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems (SiRF 2024), Jan 2024, San Antonio (TX), United States. ⟨10.1109/SiRF59913.2024.10438528⟩ ; IEEELink, 2024KonferenzZugriff:
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In: IEEE 24th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems (SiRF 2024) ; https://hal.science/hal-04487746 ; IEEE 24th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems (SiRF 2024), Jan 2024, San Antonio (TX), United States. ⟨10.1109/SiRF59913.2024.10438528⟩ ; IEEELink, 2024KonferenzZugriff:
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In: 25th IEEE Latin American Test Symposium (LATS 2024) ; https://hal.science/hal-04513585 ; 25th IEEE Latin American Test Symposium (LATS 2024), Apr 2024, Maceio (Brazil), 2024Online KonferenzZugriff:
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In: ISSN: 2169-3536, 2024Online academicJournalZugriff:
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In: ISSN: 2169-3536, 2024Online academicJournalZugriff:
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In: VLSI-SoC 2023 - 31st IFIP/IEEE International Conference on Very Large Scale Integration ; https://hal.science/hal-04305746 ; VLSI-SoC 2023 - 31st IFIP/IEEE International Conference on Very Large Scale Integration, Oct 2023, Sharjah, United Arab Emirates. ⟨10.1109/VLSI-SoC57769.2023.10321896⟩ ; https://sites.google.com/view/vlsi-soc2023/home, 2023Online KonferenzZugriff:
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In: IEEE 30th International Conference on Electronics, Circuits and Systems (ICECS 2023) ; https://hal.science/hal-04331999 ; IEEE 30th International Conference on Electronics, 2023KonferenzZugriff:
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In: 31st IFIP/IEEE Conference on Very Large Scale Integration (VLSI-SoC 2023) ; https://hal.science/hal-04331953 ; 31st IFIP/IEEE Conference on Very Large Scale Integration (VLSI-SoC 2023), Oct 2023, Sharjah, United Arab Emirates ; IEEELink, 2023KonferenzZugriff:
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In: IEEE Vision workshop, Sensors and smart (AI) processing ; https://hal.science/hal-04331928 ; IEEE Vision workshop, 2023KonferenzZugriff:
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In: VLSI-SoC 2023 - 31st IFIP/IEEE International Conference on Very Large Scale Integration ; https://hal.science/hal-04305746 ; VLSI-SoC 2023 - 31st IFIP/IEEE International Conference on Very Large Scale Integration, Oct 2023, Sharjah, United Arab Emirates. ⟨10.1109/VLSI-SoC57769.2023.10321896⟩ ; https://sites.google.com/view/vlsi-soc2023/home, 2023Online KonferenzZugriff:
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In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT 2023) ; https://hal.science/hal-04303499 ; IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT 2023), Oct 2023, Juan-les-Pins, France. pp.1-7, ⟨10.1109/DFT59622.2023.10313531⟩ ; IEEELink, 2023KonferenzZugriff:
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In: 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT 2023) ; https://hal.science/hal-04303453 ; 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT 2023), Oct 2023, Juan-les-Pins, France. ⟨10.1109/DFT59622.2023.10313564⟩ ; http://www.dfts.org/, 2023Online KonferenzZugriff:
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In: 2023 35th International Conference on Microelectronic Test Structure (ICMTS) ; https://hal.science/hal-04305404 ; 2023 35th International Conference on Microelectronic Test Structure (ICMTS), Mar 2023, Tokyo, Japan. pp.1-6, ⟨10.1109/ICMTS55420.2023.10094087⟩, 2023Online KonferenzZugriff:
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In: 2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) ; https://hal.science/hal-04305370 ; 2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM), Mar 2023, Seoul, South Korea. pp.1-3, ⟨10.1109/EDTM55494.2023.10103067⟩, 2023Online KonferenzZugriff:
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In: 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT 2023) ; https://hal.science/hal-04303453 ; 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT 2023), Oct 2023, Juan-les-Pins, France. ⟨10.1109/DFT59622.2023.10313564⟩ ; http://www.dfts.org/, 2023Online KonferenzZugriff:
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In: 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT 2023) ; https://hal.science/hal-04303453 ; 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT 2023), Oct 2023, Juan-les-Pins, France. ⟨10.1109/DFT59622.2023.10313564⟩ ; http://www.dfts.org/, 2023Online KonferenzZugriff:
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In: 53rd European Microwave Conference (EuMC 2023) ; https://hal.science/hal-04283054 ; 53rd European Microwave Conference (EuMC 2023), Sep 2023, Berlin, Germany. ⟨10.23919/EuMC58039.2023.10290583⟩ ; IEEELink, 2023KonferenzZugriff: