Suchergebnisse
Katalog
Aufsätze & mehr
Suchmaske
Suchergebnisse einschränken oder erweitern
Aktive Suchfilter
Weniger Treffer
Art der Quelle
Thema
- logic gates 73 Treffer
- silicon 61 Treffer
- metal oxide semiconductor field-effect transistors 52 Treffer
- silicon-on-insulator technology 32 Treffer
- mosfet 31 Treffer
-
45 weitere Werte:
- transistors 27 Treffer
- performance evaluation 23 Treffer
- mosfets 21 Treffer
- threshold voltage 19 Treffer
- field-effect transistors 18 Treffer
- logic circuits 17 Treffer
- random access memory 15 Treffer
- germanium 14 Treffer
- mathematical model 13 Treffer
- semiconductors 13 Treffer
- silicon-on-insulator 13 Treffer
- substrates 13 Treffer
- electrostatics 12 Treffer
- mobility 12 Treffer
- cmos integrated circuits 11 Treffer
- degradation 11 Treffer
- metal oxide semiconductors 11 Treffer
- radiation effects 11 Treffer
- ultrathin body (utb) 11 Treffer
- capacitance 10 Treffer
- complementary metal oxide semiconductors 10 Treffer
- dielectrics 10 Treffer
- electric insulators & insulation 10 Treffer
- electric potential 10 Treffer
- mosfet circuits 10 Treffer
- scattering 10 Treffer
- soi 10 Treffer
- finfets 9 Treffer
- junctions 9 Treffer
- effective mass 8 Treffer
- electronics 8 Treffer
- mos devices 8 Treffer
- surface roughness 8 Treffer
- electron mobility 7 Treffer
- integrated circuits 7 Treffer
- inverters 7 Treffer
- passivation 7 Treffer
- semiconductor device modeling 7 Treffer
- variability 7 Treffer
- aluminum gallium nitride 6 Treffer
- equations 6 Treffer
- finfet 6 Treffer
- indium gallium arsenide 6 Treffer
- monte carlo method 6 Treffer
- radio frequency 6 Treffer
Publikation
- ieee transactions on electron devices 66 Treffer
- ieee electron device letters 23 Treffer
- 2013 ieee soi-3d-subthreshold microelectronics technology unified conference (s3s) 11 Treffer
- ieee transactions on nuclear science 11 Treffer
- 2013 ieee international electron devices meeting 10 Treffer
-
45 weitere Werte:
- ieee transactions on nanotechnology 10 Treffer
- 2012 13th international conference on ultimate integration on silicon (ulis) 8 Treffer
- 2011 ieee international soi conference (soi) 5 Treffer
- 2014 soi-3d-subthreshold microelectronics technology unified conference (s3s) 5 Treffer
- 2015 ieee soi-3d-subthreshold microelectronics technology unified conference (s3s) 5 Treffer
- eurosoi-ulis 2015: 2015 joint international eurosoi workshop & international conference on ultimate integration on silicon 5 Treffer
- ieee journal of solid-state circuits 5 Treffer
- 2016 31st symposium on microelectronics technology & devices (sbmicro) 4 Treffer
- 2016 joint international eurosoi workshop & international conference on ultimate integration on silicon (eurosoi-ulis) 4 Treffer
- 28th symposium on microelectronics technology & devices (sbmicro 2013) 4 Treffer
- 2009 10th international conference on ultimate integration of silicon 3 Treffer
- 2012 international electron devices meeting 3 Treffer
- 2012 international silicon-germanium technology & device meeting (istdm) 3 Treffer
- 2015 45th european solid state device research conference (essderc) 3 Treffer
- 2015 ieee 13th international new circuits & systems conference (newcas) 3 Treffer
- proceedings of technical program of 2012 vlsi technology, system & application 3 Treffer
- 2005 international semiconductor device research symposium 2 Treffer
- 2006 ieee international soi conference proceedings 2 Treffer
- 2010 symposium on vlsi technology (vlsit) 2 Treffer
- 2011 12th international conference on ultimate integration on silicon (ulis) 2 Treffer
- 2011 ieee international conference on ic design & technology (icicdt) 2 Treffer
- 2011 international semiconductor device research symposium (isdrs) 2 Treffer
- 2011 international symposium on vlsi technology, systems & applications (vlsi-tsa) 2 Treffer
- 2012 8th international caribbean conference on devices, circuits & systems (iccdcs) 2 Treffer
- 2012 ieee 11th international conference on solid-state & integrated circuit technology 2 Treffer
- 2012 ieee faible tension faible consommation 2 Treffer
- 2012 proceedings of the european solid-state device research conference (essderc) 2 Treffer
- 2012 symposium on vlsi technology (vlsit) 2 Treffer
- 2013 proceedings of the european solid-state device research conference (essderc) 2 Treffer
- 2013 symposium on vlsi technology 2 Treffer
- 2014 12th ieee international conference on solid-state & integrated circuit technology (icsict) 2 Treffer
- 2014 29th symposium on microelectronics technology & devices (sbmicro) 2 Treffer
- 2014 44th european solid state device research conference (essderc) 2 Treffer
- 2014 ieee international conference on ic design & technology 2 Treffer
- 2014 ieee international conference on semiconductor electronics (icse2014) 2 Treffer
- 2014 ieee international solid-state circuits conference digest of technical papers (isscc) 2 Treffer
- 2015 10th international conference on availability, reliability & security 2 Treffer
- 2015 37th electrical overstress/electrostatic discharge symposium (eos/esd) 2 Treffer
- 2015 ieee international reliability physics symposium 2 Treffer
- 2015 ieee international solid-state circuits conference - (isscc) digest of technical papers 2 Treffer
- 2015 ieee international symposium on intelligent control (isic) 2 Treffer
- 2015 ieee radio frequency integrated circuits symposium (rfic) 2 Treffer
- 2015 ieee regional symposium on micro & nanoelectronics (rsm) 2 Treffer
- 2015 international symposium on vlsi technology, systems & applications 2 Treffer
- 2015 nordic circuits & systems conference (norcas): norchip & international symposium on system-on-chip (soc) 2 Treffer
Sprache
Inhaltsanbieter
349 Treffer
-
In: IEEE Transactions on Nanotechnology, Jg. 22 (2023), S. 8-13Online academicJournalZugriff:
-
In: IEEE Transactions on Electron Devices, Jg. 69 (2022-08-01), Heft 8, S. 4129-4137Online academicJournalZugriff:
-
In: IEEE Transactions on Nuclear Science, Jg. 69 (2022-08-01), Heft 8, S. 1865-1875Online academicJournalZugriff:
-
In: IEEE Transactions on Electron Devices, Jg. 69 (2022-09-01), Heft 9, S. 4828-4834Online academicJournalZugriff:
-
In: IEEE Transactions on Electron Devices, Jg. 68 (2021-07-01), Heft 7, S. 3230-3237Online academicJournalZugriff:
-
In: IEEE Transactions on Nuclear Science, Jg. 68 (2021-05-01), Heft 5, S. 850-856Online academicJournalZugriff:
-
In: IEEE Transactions on Electron Devices, Jg. 67 (2020-08-01), Heft 8, S. 3035-3041Online academicJournalZugriff:
-
In: IEEE Transactions on Circuits & Systems. Part I: Regular Papers, Jg. 68 (2021-11-01), Heft 11, S. 4810-4819Online serialPeriodicalZugriff:
-
In: IEEE Transactions on Electron Devices, Jg. 67 (2020-05-01), Heft 5, S. 1919-1923Online academicJournalZugriff:
-
In: IEEE Transactions on Nuclear Science, Jg. 66 (2019-07-01), Heft 7, S. 1398-1403Online academicJournalZugriff:
-
In: IEEE Transactions on Circuits & Systems. Part II: Express Briefs, Jg. 67 (2020-04-01), Heft 4, S. 625-629Online academicJournalZugriff:
-
In: IEEE Transactions on Nuclear Science, Jg. 67 (2020), Heft 1, S. 374-381Online academicJournalZugriff:
-
In: IEEE Transactions on Electron Devices, Jg. 68 (2021-02-01), Heft 2, S. 497-502Online academicJournalZugriff:
-
In: IEEE Transactions on Nuclear Science, Jg. 68 (2021), Heft 1, S. 21-26Online academicJournalZugriff:
-
In: IEEE Transactions on Electron Devices, Jg. 65 (2018-03-01), Heft 3, S. 895-900Online academicJournalZugriff:
-
Back-Biasing to Performance and Reliability Evaluation of UTBB FDSOI, Bulk FinFETs, and SOI FinFETs.In: IEEE Transactions on Nanotechnology, Jg. 17 (2018), Heft 1, S. 36-40Online academicJournalZugriff:
-
In: IEEE Transactions on Electron Devices, Jg. 64 (2017-11-01), Heft 11, S. 4615-4621Online academicJournalZugriff:
-
In: IEEE Transactions on Electron Devices, Jg. 64 (2017-10-01), Heft 10, S. 3986-3990Online academicJournalZugriff:
-
In: IEEE Transactions on Electron Devices, Jg. 64 (2017-04-01), Heft 4, S. 1575-1582Online academicJournalZugriff:
-
In: IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Jg. 23 (2015-12-01), Heft 12, S. 3133-3137Online academicJournalZugriff: