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Weniger Treffer
Art der Quelle
Thema
- engineered materials, dielectrics and plasmas 5 Treffer
- photonic band gap 3 Treffer
- photonics and electrooptics 3 Treffer
- gallium arsenide 2 Treffer
- power, energy and industry applications 2 Treffer
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45 weitere Werte:
- spectroscopy 2 Treffer
- substrates 2 Treffer
- 2deg 1 Treffer
- aerospace 1 Treffer
- alloying 1 Treffer
- aluminum 1 Treffer
- analytical models 1 Treffer
- band offset 1 Treffer
- cathodes 1 Treffer
- character generation 1 Treffer
- communication, networking and broadcast technologies 1 Treffer
- compounds 1 Treffer
- computational modeling 1 Treffer
- computing and processing 1 Treffer
- conferences 1 Treffer
- crystal growth 1 Treffer
- differential equations 1 Treffer
- discrete fourier transforms 1 Treffer
- electron mobility 1 Treffer
- electrons 1 Treffer
- energy states 1 Treffer
- epitaxial layers 1 Treffer
- fields, waves and electromagnetics 1 Treffer
- films 1 Treffer
- finite element modeling 1 Treffer
- gallium 1 Treffer
- gallium nitride 1 Treffer
- gan hemt 1 Treffer
- government 1 Treffer
- heterojunctions 1 Treffer
- heterostructure 1 Treffer
- insulation 1 Treffer
- integrated circuits 1 Treffer
- interface thermal resistance 1 Treffer
- laboratories 1 Treffer
- lattices 1 Treffer
- lighting 1 Treffer
- magnetic field measurement 1 Treffer
- magnetic properties 1 Treffer
- metals 1 Treffer
- numerical analysis 1 Treffer
- packaging 1 Treffer
- performance evaluation 1 Treffer
- robotics and control systems 1 Treffer
- semiconductor diodes 1 Treffer
Publikation
- 2006 ieee international conference on semiconductor electronics, semiconductor electronics, 2006. icse '06. ieee international conference on 1 Treffer
- 2008 9th international conference on solid-state and integrated-circuit technology, solid-state and integrated-circuit technology, 2008. icsict 2008. 9th international conference on 1 Treffer
- 2013 ieee international conference of electron devices and solid-state circuits, electron devices and solid-state circuits (edssc), 2013 ieee international conference of 1 Treffer
- 2016 compound semiconductor week (csw) [includes 28th international conference on indium phosphide & related materials (iprm) & 43rd international symposium on compound semiconductors (iscs), compound semiconductor week (csw) [includes 28th international conference on indium phosphide & related materials (iprm) & 43rd international symposium on compound semiconductors (iscs), 2016 1 Treffer
- 2019 18th ieee intersociety conference on thermal and thermomechanical phenomena in electronic systems (itherm), thermal and thermomechanical phenomena in electronic systems (itherm), 2019 18th ieee intersociety conference on 1 Treffer
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2 weitere Werte:
- eleventh international vacuum microelectronics conference. ivmc'98 (cat. no.98th8382), vacuum microelectronics conference, 1998. eleventh international, vacuum microelectronics 1 Treffer
- international electron devices meeting. technical digest, electron devices meeting, 1996. iedm '96., international, electron devices 1 Treffer
Inhaltsanbieter
7 Treffer
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In: 2016 Compound Semiconductor Week (CSW) [Includes 28th International Conference on Indium Phosphide & Related Materials (IPRM) & 43rd International Symposium on Compound Semiconductors (ISCS), 2016-06-01, S. 1-2Online KonferenzZugriff:
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In: 2008 9th International Conference on Solid-State and Integrated-Circuit Technology, 2008-10-01, S. 1122Online KonferenzZugriff:
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In: 2006 IEEE International Conference on Semiconductor Electronics, 2006-11-01, S. 933Online KonferenzZugriff:
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In: 2013 IEEE International Conference of Electron Devices and Solid-state Circuits, 2013-06-01, S. 1-2Online KonferenzZugriff:
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In: Eleventh International Vacuum Microelectronics Conference. IVMC'98 (Cat. No.98TH8382), 1998, S. 289-290Online KonferenzZugriff:
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In: 2019 18th IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm), 2019-05-01, S. 766-771Online KonferenzZugriff:
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In: International Electron Devices Meeting. Technical Digest, 1996, S. 929-930Online KonferenzZugriff: