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168 Treffer
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In: IEEE Transactions on Electron Devices, Jg. 69 (2022-08-01), Heft 8, S. 4129-4137Online academicJournalZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 69 (2022-08-01), Heft 8, S. 1865-1875Online academicJournalZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 69 (2022-09-01), Heft 9, S. 4828-4834Online academicJournalZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 68 (2021-07-01), Heft 7, S. 3230-3237Online academicJournalZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 68 (2021-05-01), Heft 5, S. 850-856Online academicJournalZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 67 (2020-08-01), Heft 8, S. 3035-3041Online academicJournalZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 67 (2020-05-01), Heft 5, S. 1919-1923Online academicJournalZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 67 (2020), Heft 1, S. 374-381Online academicJournalZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 66 (2019-07-01), Heft 7, S. 1398-1403Online academicJournalZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 65 (2018-08-01), Heft 8, S. 1742-1749Online academicJournalZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 68 (2021-02-01), Heft 2, S. 497-502Online academicJournalZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 68 (2021), Heft 1, S. 21-26Online academicJournalZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 64 (2017), Heft 1, part 1, S. 113-118Online academicJournalZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 65 (2018-03-01), Heft 3, S. 895-900Online academicJournalZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 64 (2017-11-01), Heft 11, S. 4615-4621Online academicJournalZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 64 (2017-10-01), Heft 10, S. 3986-3990Online academicJournalZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 66 (2019-02-01), Heft 2, S. 861-867Online academicJournalZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 64 (2017-04-01), Heft 4, S. 1575-1582Online academicJournalZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 62 (2015), Heft 1, S. 83-87Online academicJournalZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 59 (2012), Heft 1, S. 247-251Online academicJournalZugriff: